SCHEMBL171911

SCHEMBL171911

C=C(C)C(=O)CC1(CC)CCCC1

nearest known ligand 0.40

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
CYP1A2 P05177 2/20 0.34
USP2 O75604 1/20 0.34
ALDH1A1 P00352 1/20 0.34
LMNA P02545 1/20 0.34
TSHR P16473 1/20 0.34
BLM P54132 1/20 0.34
CACNA2D1 P54289 1/20 0.34
SMN1; SMN2 Q16637 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10165469 0.98 CYP1A2 (0.37) CYP1A2USP2ALDH1A1LMNATSHR
SCHEMBL10941333 0.88 ALDH1A1 (0.41) CYP1A2USP2ALDH1A1LMNATSHR
SCHEMBL15492922 0.81
SCHEMBL15492892 0.79 USP2 (0.32) CYP1A2USP2ALDH1A1LMNATSHR
SCHEMBL9895608 0.78 EPHX1 (0.31) TSHR
SCHEMBL8267491 0.77 ALDH1A1 (0.42) CYP1A2USP2ALDH1A1LMNATSHR
SCHEMBL2064950 0.76 CYP1A2 (0.38) CYP1A2USP2ALDH1A1LMNATSHR
SCHEMBL2680378 0.74 CYP1A2 (0.41) CYP1A2USP2ALDH1A1LMNATSHR
SCHEMBL14658792 0.74 CYP1A2 (0.41) CYP1A2USP2ALDH1A1LMNATSHR
SCHEMBL2920990 0.74 CYP1A2 (0.59) CYP1A2USP2ALDH1A1LMNATSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2434343-A1 Resist composition, resist film therefrom and method of forming pattern therewith Fujifilm Corporation (JP) 2012-03-28 EP disclosed
EP-2426154-A1 Photosensitive composition, pattern forming method using the photosensitive composition and compound for use in the photosensitive composition Fujifilm Corporation (JP) 2012-03-07 EP disclosed
WO-2011025070-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2011-03-03 WO disclosed
EP-2009498-A1 Pattern forming method FUJIFILM Corporation (JP) 2008-12-31 EP disclosed
EP-2003509-A2 Pattern forming method FUJIFILM Corporation (JP) 2008-12-17 EP disclosed