SCHEMBL1723366

SCHEMBL1723366

CCNN1CC=Cc2ccccc21

nearest known ligand 0.35

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
P2RX4 Q99571 9/20 0.35
P2RX1 P51575 3/20 0.35
P2RX3 P56373 3/20 0.35
P2RX7 Q99572 2/20 0.35
SMN1; SMN2 Q16637 2/20 0.35
PTBP1 P26599 1/20 0.35
NPSR1 Q6W5P4 1/20 0.35
MTNR1A P48039 2/20 0.33
MTNR1B P49286 2/20 0.33
HDAC3 O15379 1/20 0.33
HDAC1 Q13547 1/20 0.33
HDAC6 Q9UBN7 1/20 0.33
MAPT P10636 2/20 0.33
ALDH1A1 P00352 1/20 0.33
MEN1 O00255 1/20 0.32
KMT2A Q03164 1/20 0.32
SETD7 Q8WTS6 1/20 0.31
LMNA P02545 2/20 0.30
TSHR P16473 1/20 0.30
MAPK1 P28482 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL32679965 0.84 CYP4Z1 (0.36) P2RX4P2RX1P2RX3P2RX7SMN1; SMN2
SCHEMBL23043877 0.83 CYP4Z1 (0.37) P2RX4P2RX1P2RX3MTNR1AMTNR1B
SCHEMBL8472507 0.80 P2RX4 (0.37) P2RX4P2RX1P2RX3P2RX7SMN1; SMN2
SCHEMBL28611007 0.75 KDM4E (0.36) MTNR1AMTNR1BMAPTALDH1A1MEN1
SCHEMBL11129882 0.74 P2RX4 (0.40) P2RX4P2RX1P2RX3LMNATSHR
SCHEMBL27622499 0.74 P2RX4 (0.35) P2RX4P2RX1P2RX3P2RX7SMN1; SMN2
SCHEMBL29486049 0.73 MAPT (0.38) P2RX4P2RX1P2RX3P2RX7SMN1; SMN2
SCHEMBL3714615 0.73 MAPT (0.38) P2RX4P2RX1P2RX3P2RX7SMN1; SMN2
SCHEMBL6248335 0.72 PSEN1 (0.38) P2RX4P2RX1P2RX3P2RX7SMN1; SMN2
Iodide SCHEMBL11405105 0.71 MAPT (0.37) P2RX4P2RX1P2RX3P2RX7SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8450931-B2 Process for minimizing electromigration in an electronic device DOW CORNING CORPORATION (US) 2013-05-28 US claimed
EP-1880416-B1 PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE DOW CORNING (US) 2012-01-18 EP claimed
US-20080054806-A1 Process for Minimizing Electromigration in an Electronic Device DOW CORNING CORPORATION 2008-03-06 US claimed
EP-1880416-A1 PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE Dow Corning Corporation (US) 2008-01-23 EP claimed
WO-2006122025-A1 PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE DOW CORNING CORPORATION (US) 2006-11-16 WO claimed
US-8450931-B2 Process for minimizing electromigration in an electronic device DOW CORNING CORPORATION (US) 2013-05-28 US disclosed
EP-1880416-B1 PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE DOW CORNING (US) 2012-01-18 EP disclosed
US-20080054806-A1 Process for Minimizing Electromigration in an Electronic Device DOW CORNING CORPORATION 2008-03-06 US disclosed
EP-1880416-A1 PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE Dow Corning Corporation (US) 2008-01-23 EP disclosed
WO-2006122025-A1 PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE DOW CORNING CORPORATION (US) 2006-11-16 WO disclosed