SCHEMBL1742974

SCHEMBL1742974

C=CC1(CCCCCC)NC1=O

nearest known ligand 0.41

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
CPT1A P50416 1/20 0.40
MMP2 P08253 8/20 0.39
MMP9 P14780 8/20 0.39
MMP3 P08254 2/20 0.39
MMP8 P22894 5/20 0.38
MMP13 P45452 5/20 0.38
TYMP P19971 1/20 0.37
MEN1 O00255 1/20 0.36
GAA P10253 1/20 0.36
ALOX12 P18054 1/20 0.36
KMT2A Q03164 1/20 0.36
TSHR P16473 1/20 0.35
CYP19A1 P11511 4/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL531179 0.92 HSD17B10 (0.34) CPT1AMMP2MMP9MMP3MMP13
SCHEMBL532319 0.78 MMP9 (0.36) MMP9MEN1KMT2A
SCHEMBL16053224 0.73 MMP9 (0.46) CPT1AMMP2MMP9MMP3MMP8
SCHEMBL531339 0.70 TSHR (0.40) MMP9MEN1KMT2ATSHR
SCHEMBL18529897 0.68 CYP19A1 (0.44) CPT1ATSHRCYP19A1
SCHEMBL11534423 0.67 MMP2 (0.47) MMP2MMP9MMP3MMP8MMP13
SCHEMBL11484713 0.67 MMP2 (0.47) MMP2MMP9MMP3MMP8MMP13
SCHEMBL10407006 0.67 MMP2 (0.47) MMP2MMP9MMP3MMP8MMP13
SCHEMBL5450754 0.65 MMP9 (0.67) MMP2MMP9MMP3MMP8MMP13
SCHEMBL468545 0.65 MMP9 (0.67) MMP2MMP9MMP3MMP8MMP13

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2389612-A1 A PHOTORESIST IMAGE-FORMING PROCESS USING DOUBLE PATTERNING AZ Electronic Materials USA Corp. (US) 2011-11-30 EP disclosed
WO-2010084372-A1 A PHOTORESIST IMAGE-FORMING PROCESS USING DOUBLE PATTERNING AZ ELECTRONIC MATERIALS USA CORP. (US) 2010-07-29 WO disclosed
EP-2158277-A2 A COMPOSITION FOR COATING OVER A PHOTORESIST PATTERN COMPRISING A LACTEM AZ Electronic Materials USA Corp. (US) 2010-03-03 EP disclosed
WO-2008122884-A2 A COMPOSITION FOR COATING OVER A PHOTORESIST PATTERN COMPRISING A LACTEM AZ ELECTRONIC MATERIALS USA CORP. (DE) 2008-10-16 WO disclosed