SCHEMBL1839152

SCHEMBL1839152

C=C(C)C(=O)NC(C)(C)CS(=O)(=O)O.C=C(C)C(=O)OC.C=CC(=O)OCC(F)(F)F

nearest known ligand 0.33

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.33
TSHR P16473 1/20 0.31
TP53 P04637 1/20 0.31
CYP3A4 P08684 1/20 0.31
MAPK1 P28482 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
HIF1A Q16665 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1825618 0.83 ALDH1A1 (0.31) ALDH1A1TSHRCYP3A4
SCHEMBL1843381 0.82
Methacrylic Acid SCHEMBL9137100 0.78 ALDH1A1 (0.44) ALDH1A1TSHRTP53CYP3A4MAPK1
Acrylic Acid Ethyl Ester SCHEMBL1822973 0.77 ALDH1A1 (0.33) ALDH1A1TSHRTP53CYP3A4MAPK1
SCHEMBL9299705 0.77 ALDH1A1 (0.43) ALDH1A1TSHRCYP3A4
SCHEMBL19597 0.75 TGFBR1 (0.35)
SCHEMBL9773819 0.74 ALDH1A1 (0.40) ALDH1A1TSHRCYP3A4
Vinylsulfonic Acid SCHEMBL9481117 0.74 TGFBR1 (0.31)
Methacrylic Acid SCHEMBL27682856 0.74 ALDH1A1 (0.40) ALDH1A1TSHRCYP3A4
SCHEMBL30013661 0.74 ALDH1A1 (0.46) ALDH1A1TSHRTP53CYP3A4MAPK1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1818723-B1 COMPOSITION FOR FORMING ANTIREFLECTION FILM, LAYERED PRODUCT, AND METHOD OF FORMING RESIST PATTERN JSR CORP (JP) 2011-05-04 EP disclosed
US-7709182-B2 Composition for forming antireflection film, layered product, and method of forming resist pattern JSR CORPORATION (JP) 2010-05-04 US disclosed
US-20080124524-A1 Composition For Forming Antireflection Film, Layered Product, And Method Of Forming Resist Pattern JSR CORPORATION (JP) 2008-05-29 US disclosed
EP-1818723-A1 COMPOSITION FOR FORMING ANTIREFLECTION FILM, LAYERED PRODUCT, AND METHOD OF FORMING RESIST PATTERN JSR Corporation (JP) 2007-08-15 EP disclosed