SCHEMBL1825618

SCHEMBL1825618

C=C(C)C(=O)OC.C=CC(=O)NC(C)(C)CS(=O)(=O)O.C=CC(=O)OCC(F)(F)C(F)(F)F

nearest known ligand 0.31

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.31
TSHR P16473 1/20 0.30
CYP3A4 P08684 1/20 0.30
CYP2C9 P11712 1/20 0.30
CYP2C19 P33261 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9299705 0.85 ALDH1A1 (0.43) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
SCHEMBL1839152 0.83 ALDH1A1 (0.33) ALDH1A1TSHRCYP3A4
Methacrylic Acid SCHEMBL27682856 0.82 ALDH1A1 (0.40) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
Acrylic Acid Ethyl Ester SCHEMBL1822973 0.78 ALDH1A1 (0.33) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
SCHEMBL7911836 0.77 ALDH1A1 (0.36) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
Acrylic Acid Methyl Ester SCHEMBL8758796 0.77 ALDH1A1 (0.41) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
SCHEMBL8965669 0.75 ALDH1A1 (0.35) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
SCHEMBL28820478 0.75 ALDH1A1 (0.44) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
Methacrylic Acid SCHEMBL27702048 0.75 TSHR (0.44) ALDH1A1TSHRCYP3A4CYP2C9CYP2C19
Itaconate SCHEMBL9138161 0.74 ALOX15 (0.42) ALDH1A1TSHRCYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1818723-B1 COMPOSITION FOR FORMING ANTIREFLECTION FILM, LAYERED PRODUCT, AND METHOD OF FORMING RESIST PATTERN JSR CORP (JP) 2011-05-04 EP disclosed
US-7709182-B2 Composition for forming antireflection film, layered product, and method of forming resist pattern JSR CORPORATION (JP) 2010-05-04 US disclosed
US-20080124524-A1 Composition For Forming Antireflection Film, Layered Product, And Method Of Forming Resist Pattern JSR CORPORATION (JP) 2008-05-29 US disclosed
EP-1818723-A1 COMPOSITION FOR FORMING ANTIREFLECTION FILM, LAYERED PRODUCT, AND METHOD OF FORMING RESIST PATTERN JSR Corporation (JP) 2007-08-15 EP disclosed