SCHEMBL18600577

SCHEMBL18600577

Oc1cc2ccccc2c2ccc3c4ccccc4c4ccccc4c3c12

nearest known ligand 0.68

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TRPM4 Q8TD43 1/20 0.68
CYP1A2 P05177 3/20 0.50
ERBB2 P04626 1/20 0.50
FYN P06241 1/20 0.50
MAOA P21397 1/20 0.50
ACHE P22303 1/20 0.50
AHR P35869 1/20 0.50
NQO2 P16083 1/20 0.48
HPRT1 P00492 3/20 0.48
ALDH1A1 P00352 3/20 0.45
HSD17B10 Q99714 3/20 0.45
HPGD P15428 2/20 0.45
HIF1A Q16665 2/20 0.45
TSHR P16473 1/20 0.45
MAPK1 P28482 1/20 0.45
CASP1 P29466 1/20 0.45
L3MBTL1 Q9Y468 1/20 0.45
CYP1B1 Q16678 1/20 0.44
THRB P10828 1/20 0.44
MYC P01106 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27760500 0.89 TRPM4 (0.65) TRPM4CYP1A2ERBB2FYNMAOA
SCHEMBL25622486 0.85 TRPM4 (0.59) TRPM4CYP1A2ERBB2FYNMAOA
SCHEMBL16554732 0.83 TRPM4 (0.52) TRPM4CYP1A2ERBB2FYNMAOA
SCHEMBL16107767 0.83 TRPM4 (0.61) TRPM4CYP1A2ERBB2FYNMAOA
SCHEMBL508755 0.81 TRPM4 (1.00) TRPM4CYP1A2NQO2HPRT1ALDH1A1
SCHEMBL4852383 0.81 ALDH1A1 (0.59) TRPM4CYP1A2ERBB2FYNMAOA
SCHEMBL29399180 0.81 TRPM4 (1.00) TRPM4CYP1A2NQO2HPRT1ALDH1A1
SCHEMBL28009661 0.81 TRPM4 (0.72) TRPM4CYP1A2ERBB2FYNMAOA
SCHEMBL4947995 0.80 CYP1A2 (0.53) TRPM4CYP1A2ERBB2FYNMAOA
SCHEMBL4854639 0.79 ALDH1A1 (0.56) TRPM4CYP1A2ERBB2FYNMAOA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20220089811-A1 COMPOSITION FOR FILM FORMATION, RESIST COMPOSITION, RADIATION-SENSITIVE COMPOSITION, METHOD FOR PRODUCING AMORPHOUS FILM, RESIST PATTERN FORMATION METHOD, COMPOSITION FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, AND CIRCUIT PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2022-03-24 US disclosed
US-20220089810-A1 POLYCYCLIC POLYPHENOLIC RESIN AND METHOD FOR PRODUCING POLYCYCLIC POLYPHENOLIC RESIN MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2022-03-24 US disclosed
WO-2022045270-A1 METHOD FOR PURIFYING COMPOUND OR POLYMER 三菱瓦斯化学株式会社 2022-03-03 WO disclosed
EP-3141957-B1 RESIST MATERIAL, RESIST COMPOSITION, AND RESIST PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL CO (JP) 2021-03-24 EP disclosed
WO-2020145407-A1 POLYCYCLIC POLYPHENOL RESIN AND PRODUCTION METHOD FOR POLYCYCLIC POLYPHENOL RESIN 三菱瓦斯化学株式会社 2020-07-16 WO disclosed
WO-2020145406-A1 FILM FORMING COMPOSITION, RESIST COMPOSITION, RADIATION-SENSITIVE COMPOSITION, METHOD FOR PRODUCING AMORPHOUS FILM, RESIST PATTERN FORMATION METHOD, COMPOSITION FOR FORMING LOWER LAYER FILM FOR LITHOGRAPHY, METHOD FOR PRODUCING LOWER LAYER FILM FOR LITHOGRAPHY, AND CIRCUIT PATTERN FORMATION METHOD 三菱瓦斯化学株式会社 2020-07-16 WO disclosed
US-10437148-B2 Resist material, resist composition and method for forming resist pattern MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2019-10-08 US disclosed
US-10310377-B2 Material for forming film for lithography, composition for forming film for lithography, film for lithography, pattern forming method and purification method MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2019-06-04 US disclosed
EP-3141959-B1 LITHOGRAPHIC FILM FORMATION MATERIAL, COMPOSITION FOR LITHOGRAPHIC FILM FORMATION, LITHOGRAPHIC FILM, PATTERN FORMATION METHOD, AND PURIFICATION METHOD MITSUBISHI GAS CHEMICAL CO (JP) 2019-01-30 EP disclosed
US-20170145142-A1 RESIST MATERIAL, RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2017-05-25 US disclosed
US-20170144954-A1 MATERIAL FOR FORMING FILM FOR LITHOGRAPHY, COMPOSITION FOR FORMING FILM FOR LITHOGRAPHY, FILM FOR LITHOGRAPHY, PATTERN FORMING METHOD AND PURIFICATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2017-05-25 US disclosed
EP-3141959-A1 LITHOGRAPHIC FILM FORMATION MATERIAL, COMPOSITION FOR LITHOGRAPHIC FILM FORMATION, LITHOGRAPHIC FILM, PATTERN FORMATION METHOD, AND PURIFICATION METHOD Mitsubishi Gas Chemical Company, Inc. (JP) 2017-03-15 EP disclosed
EP-3141957-A1 RESIST MATERIAL, RESIST COMPOSITION, AND RESIST PATTERN FORMATION METHOD Mitsubishi Gas Chemical Company, Inc. (JP) 2017-03-15 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20170144954-A1 MATERIAL FOR FORMING FILM FOR LITHOGRAPHY, COMPOSITION FOR FORMING FILM FOR LITHOGRAPHY, FILM FOR LITHOGRAPHY, PATTERN FORMING METHOD AND PURIFICATION METHOD FRG1, MLLT3, FEM1B TRPM4 770/4885CYP1A2 3665/4885ERBB2 2583/4885
US-10310377-B2 Material for forming film for lithography, composition for forming film for lithography, film for lithography, pattern forming method and purification method FRG1, MLLT3, FEM1B TRPM4 770/4885CYP1A2 3665/4885ERBB2 2583/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.