SCHEMBL196533

SCHEMBL196533

Cc1ccc(S(=O)(=O)O)c(Cc2ccccc2[N+](=O)[O-])c1

nearest known ligand 0.46

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
ACHE P22303 1/20 0.46
ALDH1A1 P00352 3/20 0.42
CA12 O43570 1/20 0.42
TSHR P16473 2/20 0.42
MAPT P10636 1/20 0.41
MAPK1 P28482 1/20 0.41
CYP3A4 P08684 1/20 0.41
SMN1; SMN2 Q16637 3/20 0.40
MEN1 O00255 1/20 0.40
NPC1 O15118 1/20 0.40
RAB9A P51151 1/20 0.40
KMT2A Q03164 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1228376 1.00 ACHE (0.46) ACHEALDH1A1CA12TSHRMAPT
SCHEMBL712409 0.89 TSHR (0.42) ACHEALDH1A1CA12TSHRCYP3A4
SCHEMBL29980766 0.88 ACHE (0.39) ACHEALDH1A1CA12MAPTSMN1; SMN2
SCHEMBL284469 0.87 TSHR (0.41) ACHEALDH1A1TSHRCYP3A4SMN1; SMN2
SCHEMBL1476156 0.87 TSHR (0.41) ACHEALDH1A1TSHRCYP3A4SMN1; SMN2
SCHEMBL1453562 0.86 TSHR (0.43) ACHEALDH1A1TSHRMAPK1CYP3A4
SCHEMBL1453554 0.86 TSHR (0.43) ACHEALDH1A1TSHRMAPK1CYP3A4
SCHEMBL6005448 0.85 CYP1A2 (0.47) ACHEALDH1A1TSHRMAPTMAPK1
SCHEMBL3841599 0.85 TDP1 (0.44) ACHEALDH1A1TSHRCYP3A4SMN1; SMN2
SCHEMBL283800 0.85 CYP1A2 (0.47) ACHEALDH1A1TSHRMAPTMAPK1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 861 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250334883-A1 RESIST UNDERLAYER COMPOSITIONS, AND METHODS OF FORMING PATTERNS USING THE COMPOSITIONS SAMSUNG SDI CO LTD (KR) 2025-10-30 US claimed
US-20240294771-A1 ANTI-REFLECTIVE COATING COMPOSITION AND CROSSLINKABLE POLYMER Tan Kah Kee Innovation Laboratory (CN) 2024-09-05 US claimed
CN-118244576-A Photosensitive resin composition and cured film thereof 罗门哈斯电子材料韩国有限公司 2024-06-25 CN claimed
WO-2024006254-A2 TRI-CURE HYBRID ORGANO-SILICON COATINGS BOWLING GREEN STATE UNIVERSITY (US) 2024-01-04 WO claimed
WO-2023070957-A1 ANTI-REFLECTIVE COATING COMPOSITION AND CROSSLINKABLE POLYMER 嘉庚创新实验室 2023-05-04 WO claimed
CN-113913075-B Anti-reflective coating composition and crosslinkable polymer 嘉庚创新实验室 2022-09-20 CN claimed
CN-113913075-A Anti-reflective coating composition and crosslinkable polymer 嘉庚创新实验室 2022-01-11 CN claimed
US-11169441-B2 Composition for forming resist underlayer film, resist underlayer film, method for forming resist pattern and method for producing semiconductor device NISSAN CHEMICAL CORPORATION (JP) 2021-11-09 US claimed
EP-1380895-B1 Chemically amplified resist material FUJITSU LTD (JP) 2018-07-04 EP claimed
EP-2493991-B1 ANTIREFLECTIVE COMPOSITION FOR PHOTORESISTS MERCK PATENT GMBH (DE) 2016-03-02 EP claimed
EP-2052293-B1 ANTIREFLECTIVE COMPOSITION FOR PHOTORESISTS AZ ELECTRONIC MATERIALS USA (US) 2013-03-13 EP claimed
EP-1563343-B1 ANTIREFLECTIVE COMPOSITIONS FOR PHOTORESISTS AZ ELECTRONIC MATERIALS USA (US) 2012-01-11 EP claimed
US-20110117501-A1 RESIST UNDERLAYER POLYMER, RESIST UNDERLAYER COMPOSITION INCLUDING THE SAME, AND METHOD OF PATTERNING USING THE SAME CHEIL INDUSTRIES, INC. (KR) 2011-05-19 US claimed
EP-1131678-B1 ANTIREFLECTIVE COMPOSITION FOR A DEEP ULTRAVIOLET PHOTORESIST AZ ELECTRONIC MATERIALS USA (US) 2009-07-08 EP claimed
EP-1046958-B1 USE OF A COMPOSITION FOR BOTTOM REFLECTION PREVENTIVE FILM AZ ELECTRONIC MATERIALS USA (US) 2006-04-12 EP claimed
US-6488509-B1 Plug filling for dual-damascene process TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY (TW) 2002-12-03 US claimed
EP-0762207-B1 Positive working photosensitive composition and method of producing relief structures BASF AG (DE) 2000-04-12 EP claimed
EP-0708934-B1 RADIATION-SENSITIVE PAINT COMPOSITION SIEMENS AG (DE) 1998-10-21 EP claimed
US-5648195-A Radiation-sensitive resist composition comprising a diazoketone SIEMENS AKTIENGESELLSCHAFT (DE) 1997-07-15 US claimed
EP-0762207-A2 Positive working photosensitive composition and method of producing relief structures BASF AKTIENGESELLSCHAFT (DE) 1997-03-12 EP claimed