Biphenyl

Biphenyl

SCHEMBL1998395

COc1ccc(S)cc1.O=S(=O)(O)C(F)(F)F.c1ccc(-c2ccccc2)cc1

nearest known ligand 0.43

Full drug profile on Sugi Atlas →

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
BACE1 P56817 2/20 0.43
PTPN1 P18031 1/20 0.41
HDAC4 P56524 1/20 0.41
HDAC2 Q92769 1/20 0.41
HDAC8 Q9BY41 1/20 0.41
MMP9 P14780 5/20 0.40
MMP2 P08253 4/20 0.40
MMP12 P39900 3/20 0.40
MMP1 P03956 3/20 0.40
MMP13 P45452 3/20 0.40
CES2 O00748 1/20 0.40
CES1 P23141 1/20 0.40
KCNH2 Q12809 1/20 0.40
SMN1; SMN2 Q16637 1/20 0.39
MMP8 P22894 2/20 0.39
MMP3 P08254 1/20 0.39
MMP14 P50281 1/20 0.39
MMP16 P51512 1/20 0.39
CA1 P00915 1/20 0.39
CA2 P00918 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trifluoromethanesulfonic Acid SCHEMBL3385544 0.91 HSD11B1 (0.44) HDAC4HDAC2HDAC8MMP9MMP2
Trifluoromethanesulfonic Acid SCHEMBL27572558 0.89 BACE1 (0.50) BACE1PTPN1HDAC4HDAC2HDAC8
Trifluoromethanesulfonic Acid SCHEMBL27925853 0.89 BACE1 (0.50) BACE1PTPN1HDAC4HDAC2HDAC8
Trifluoromethanesulfonic Acid SCHEMBL31473545 0.85 PTPN1 (0.53) PTPN1HDAC8MMP2MMP3MMP14
Biphenyl SCHEMBL28044662 0.85 PTPN1 (0.39) PTPN1HDAC4HDAC2HDAC8MMP9
Anisole SCHEMBL4551224 0.84 CA4 (0.56) BACE1CES2CES1CA1CA2
Biphenyl SCHEMBL1993781 0.83 PTPN1 (0.44) PTPN1MMP9MMP2MMP1MMP13
Trifluoromethanesulfonic Acid SCHEMBL17907399 0.81 CA1 (0.44) PTPN1HDAC2MMP1MMP13SMN1; SMN2
Biphenyl SCHEMBL27775707 0.81 MMP3 (0.47) PTPN1KCNH2MMP3RAB9AGAA
Biphenyl SCHEMBL1992773 0.80 PTPN1 (0.45) PTPN1NPC1RAB9A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 85 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2026107261-A1 PURIFICATION OF PHOTORESIST POLYMER BY SURFACE-MODIFIED POROUS POLYETHYLENE MEMBRANE ENTEGRIS, INC. (US) 2026-05-21 WO claimed
US-7399570-B2 Water-soluble negative photoresist polymer and composition containing the same HYNIX SEMICONDUCTOR INC. (KR) 2008-07-15 US claimed
US-7361447-B2 Photoresist polymer and photoresist composition containing the same HYNIX SEMICONDUCTOR INC. (KR) 2008-04-22 US claimed
US-7338742-B2 Photoresist polymer and photoresist composition containing the same HYNIX SEMICONDUCTOR INC. (KR) 2008-03-04 US claimed
US-7282318-B2 Photoresist composition for EUV and method for forming photoresist pattern using the same HYNIX SEMICONDUCTOR INC. (KR) 2007-10-16 US claimed
US-7279256-B2 Photoresist polymer and photoresist composition containing the same HYNIX SEMICONDUCTOR INC. (KR) 2007-10-09 US claimed
US-7270934-B2 Water-soluble negative photoresist polymer, composition containing the same, and method of forming a photoresist pattern HYNIX SEMICONDUCTOR INC. (KR) 2007-09-18 US claimed
US-20070154837-A1 Composition for hard mask and method for manufacturing semiconductor device HYNIX SEMICONDUCTOR INC. (KR) 2007-07-05 US claimed
US-7235349-B2 Process for forming an ultra fine pattern using a bottom anti-reflective coating film containing an acid generator HYNIX SEMICONDUCTOR INC. (KR) 2007-06-26 US claimed
US-7138218-B2 Process for forming an ultra fine pattern using a bottom anti-reflective coating film containing an acid generator HYNIX SEMICONDUCTOR INC. (KR) 2006-11-21 US claimed
US-20040265743-A1 Photoresist polymer and photoresist composition including the same HYNIX SEMICONDUCTOR INC. (KR) 2004-12-30 US claimed
US-20040265735-A1 Photoresist polymer and photoresist composition containing the same HYNIX SEMICONDUCTOR INC. (KR) 2004-12-30 US claimed
US-6818376-B2 OVERCOATING SEMICONDUCTOR SUBSTRATE WITH PHOTOSENSITIVE POLYMER; EXPOSURE TO RADIATION IN PRESENCE OF ACID GENERATOR HYNIX SEMICONDUCTOR INC. (KR) 2004-11-16 US claimed
US-6806025-B2 FLUORINATED FUSED RING MONOMERS AND POLYMERS; MAYBE COPOLYMERIZED WITH A SUBSTITUTED MALEIMIDE AND/OR A TRIFLUOROMETHYL ACRYLATE HYNIX SEMICONDUCTOR INC. (KR) 2004-10-19 US claimed
US-20030148212-A1 Process for forming an ultra fine pattern using a bottom anti-reflective coating film containing an acid generator HYNIX SEMICONDUCTOR INC. (KR) 2003-08-07 US claimed
US-20030091927-A1 Photoresist monomers, polymers and photoresist compositions for preventing acid diffusion HYNIX SEMICONDUCTOR INC. (KR) 2003-05-15 US claimed
US-20030022101-A1 Photoresist monomers, polymers thereof and photoresist compositions containing the same INTELLECTUAL DISCOVERY CO. LTD. (KR) 2003-01-30 US claimed
US-20030022100-A1 Photoresist monomers, polymers thereof and photoresist compositions containing the same HYNIX SEMICONDUCTOR INC. (KR) 2003-01-30 US claimed
US-20030003379-A1 Photoresist monomers, polymers thereof and photoresist compositons containing the same HYNIX SEMICONDUCTOR INC. (KR) 2003-01-02 US claimed
US-20020160301-A1 Cross-linker monomer comprising double bond and photoresist copolymer containing the same HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. (KR) 2002-10-31 US claimed