SCHEMBL2104143

SCHEMBL2104143

CCN[SiH](Cl)c1ccccc1

nearest known ligand 0.36

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
KCNN4 O15554 1/20 0.35
TP53 P04637 1/20 0.33
SIGMAR1 Q99720 1/20 0.32
LMNA P02545 1/20 0.31
HTR2A P28223 1/20 0.30
HRH1 P35367 1/20 0.30
TDP1 Q9NUW8 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14813091 0.78 ACHE (0.39) LMNATDP1
SCHEMBL2100400 0.77 TAAR1 (0.42) SIGMAR1HTR2AHRH1
SCHEMBL2102932 0.76 KCNN4 (0.38) KCNN4TP53SIGMAR1LMNATDP1
SCHEMBL2268660 0.76 KCNN4 (0.38) KCNN4TP53SIGMAR1LMNATDP1
SCHEMBL2274480 0.74 KCNN4 (0.37) KCNN4TP53SIGMAR1LMNATDP1
SCHEMBL2103258 0.74 TAAR1 (0.39) SIGMAR1HTR2AHRH1
SCHEMBL2101473 0.73 TSHR (0.38) KCNN4LMNATDP1
SCHEMBL2269967 0.73 KCNN4 (0.35) KCNN4TP53SIGMAR1LMNATDP1
SCHEMBL14797999 0.72 HPGD (0.35) LMNA
SCHEMBL14813061 0.72 TSHR (0.35)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8993072-B2 Halogenated organoaminosilane precursors and methods for depositing films comprising same AIR PRODUCTS AND CHEMICALS, INC. (US) 2015-03-31 US claimed
EP-2574611-B1 Halogenated Organoaminosilane Precursors and Methods for Depositing Films Comprising Same AIR PROD & CHEM (US) 2016-03-23 EP disclosed
EP-2574611-A1 Halogenated Organoaminosilane Precursors and Methods for Depositing Films Comprising Same AIR PRODUCTS AND CHEMICALS, INC. (US) 2013-04-03 EP disclosed
US-8404584-B2 Method of manufacturing semiconductor device FUJITSU LIMITED (JP) 2013-03-26 US disclosed
US-8164166-B2 Interfacial roughness reducing film, wiring layer, semiconductor device, and method of manufacturing semiconductor device FUJITSU LIMITED (JP) 2012-04-24 US disclosed
US-20110207319-A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE FUJITSU LIMITED (JP) 2011-08-25 US disclosed
US-20090085170-A1 INTERFACIAL ROUGHNESS REDUCING FILM, WIRING LAYER, SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE FUJITSU LIMITED (JP) 2009-04-02 US disclosed