SCHEMBL211006

SCHEMBL211006

[CH2]C(CC(=O)O)OCC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28052065 0.82 GPR84 (0.35)
SCHEMBL211364 0.81 ALDH1A1 (0.41)
SCHEMBL22129515 0.79 GPR84 (0.41)
SCHEMBL202165 0.75 SLC22A6 (0.39)
SCHEMBL210088 0.75
SCHEMBL22906066 0.73
SCHEMBL156206 0.73
SCHEMBL5454693 0.73 TSHR (0.39)
SCHEMBL27438161 0.73 MEN1 (0.38)
SCHEMBL2185057 0.71 PPARA (0.42)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 237 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2020209223-A1 POWDER DISPERSION, PRODUCTION METHOD FOR POWDER DISPERSION, AND PRODUCTION METHOD FOR RESIN-INCLUDING SUBSTRATE AGC株式会社 2020-10-15 WO claimed
US-12025919-B2 Method of storing photoresist coated substrates and semiconductor substrate container arrangement TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2024-07-02 US disclosed
US-11977333-B2 Semiconductor devices and methods of manufacturing TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2024-05-07 US disclosed
US-11971657-B2 Photoresist developer and method of developing photoresist TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2024-04-30 US disclosed
US-20240118618-A1 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2024-04-11 US disclosed
US-20240096623-A1 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2024-03-21 US disclosed
US-20240079235-A1 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING TAIWAN SEMICONDUCTOR MFG CO LTD (TW) 2024-03-07 US disclosed
US-11842896-B2 Semiconductor devices and methods of manufacturing TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2023-12-12 US disclosed
US-20230393474-A1 PHOTORESIST UNDERLAYER AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2023-12-07 US disclosed
US-20230393475-A1 METALLIC PHOTORESIST PATTERNING AND DEFECT IMPROVEMENT TAIWAN SEMICONDUCTOR MFG CO LTD (TW) 2023-12-07 US disclosed
CN-101247938-A Method for producing cellulose acylate film, polarizing plate and liquid crystal display FUJIFILM CORP (JP) 2008-08-20 CN disclosed
CN-101163464-A Polymeric implants, preferably containing a mixture of PEG and PLG, for controlled release of a GnRH DOURETKORT COMPANY (US) 2008-04-16 CN disclosed
US-20070172769-A1 Pattern forming method FUJIFILM CORPORATION (JP) 2007-07-26 US disclosed
US-20070172768-A1 Pattern forming method FUJIFILM CORPORATION (JP) 2007-07-26 US disclosed
EP-1811339-A1 Pattern forming method Fujifilm Corporation (JP) 2007-07-25 EP disclosed
EP-1811338-A2 Pattern forming method Fujifilm Corporation (JP) 2007-07-25 EP disclosed
CN-1946778-A Cellulose acylate film, polarizing plate and liquid crystal display FUJI PHOTO FILM CO LTD (JP) 2007-04-11 CN disclosed
CN-1222826-C Silver halide colour photographic light-sensitive material FUJI PHOTO FILM CO LTD (JP) 2005-10-12 CN disclosed
CN-1340740-A Silver halide colour photographic light-sensitive material FUJI PHOTO FILM CO LTD (JP) 2002-03-20 CN disclosed
CN-1057343-A SILVER HALIDE COLOR PHOTOGRAPHIC MATERIALS FUJI PHOTO FILM CO LTD (JP) 1991-12-25 CN disclosed