SCHEMBL21251557

SCHEMBL21251557

C=CC(=O)OC1(C)CC2CC(C1)C(C(=O)OC(CS(=O)(=O)O)(C(F)(F)F)C(F)(F)F)C2

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19596887 0.86 — —
SCHEMBL22364001 0.74 POLB (0.38) —
SCHEMBL13079566 0.74 POLB (0.38) —
SCHEMBL18476386 0.72 — —
SCHEMBL20052927 0.71 — —
SCHEMBL18470622 0.69 TSHR (0.32) —
SCHEMBL20014036 0.68 CYP17A1 (0.31) —
SCHEMBL23140675 0.68 — —
SCHEMBL19961444 0.68 CYP19A1 (0.33) —
SCHEMBL18470619 0.67 ALDH1A1 (0.33) —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4276533-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2023-11-15 — — EP disclosed
EP-4276534-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION Shin-Etsu Chemical Co., Ltd. (JP) 2023-11-15 — — EP disclosed
EP-4047418-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2023-08-16 — — EP disclosed
EP-4047417-B1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2023-08-16 — — EP disclosed
EP-3343291-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2019-08-14 — — EP disclosed
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