SCHEMBL21392499

SCHEMBL21392499

C=C(Cl)C(=O)OC12CC3CC(CC(C3)C1)C2

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CYP19A1 P11511 4/20 0.39
NAAA Q02083 1/20 0.37
NPSR1 Q6W5P4 3/20 0.36
CYP17A1 P05093 3/20 0.36
EPHX2 P34913 2/20 0.36
EPHX1 P07099 1/20 0.34
CA2 P00918 1/20 0.34
TSHR P16473 1/20 0.33
TGM2 P21980 1/20 0.33
MEN1 O00255 1/20 0.32
ALDH1A1 P00352 1/20 0.32
HTT P42858 1/20 0.32
KMT2A Q03164 1/20 0.32
GLA P06280 1/20 0.32
THRB P10828 1/20 0.31
CYP2C9 P11712 1/20 0.31
GAA P10253 1/20 0.31
SCN1A P35498 1/20 0.31
SCN2A Q99250 1/20 0.31
SCN3A Q9NY46 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16369107 0.85 CYP19A1 (0.40) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL27736443 0.84 CYP19A1 (0.44) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL8399502 0.83 CYP19A1 (0.39) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL7928678 0.83 CYP19A1 (0.41) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL22769989 0.82 CYP19A1 (0.38) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL45476 0.82 NAAA (0.40) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL21123182 0.81 CYP19A1 (0.39) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL28138951 0.80 NAAA (0.39) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL15348585 0.80 CYP19A1 (0.37) CYP19A1NAAANPSR1CYP17A1EPHX2
SCHEMBL7928675 0.79 CYP19A1 (0.39) CYP19A1NAAANPSR1CYP17A1EPHX2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119200332-A Layered structure for electron beam lithography process and lithography process thereof 国科天骥(山东)新材料有限责任公司 2024-12-27 CN claimed
CN-119179230-A Electron beam photoresist composition containing self-crosslinking resin and preparation method and application thereof 国科天骥(山东)新材料有限责任公司 2024-12-24 CN claimed
CN-119200332-A Layered structure for electron beam lithography process and lithography process thereof 国科天骥(山东)新材料有限责任公司 2024-12-27 CN disclosed
CN-119179230-A Electron beam photoresist composition containing self-crosslinking resin and preparation method and application thereof 国科天骥(山东)新材料有限责任公司 2024-12-24 CN disclosed
US-11960207-B2 Resist composition and resist film ZEON CORPORATION (JP) 2024-04-16 US disclosed
CN-113773433-B Polymer resin and preparation method thereof, method for improving cracking of electron beam photoresist, electron beam photoresist and preparation and use thereof 江苏汉拓光学材料有限公司 2023-12-29 CN disclosed
US-20210055654-A1 RESIST COMPOSITION AND RESIST FILM ZEON CORPORATION (JP) 2021-02-25 US disclosed
US-20200407477-A1 POLYMER, POSITIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN ZEON CORPORATION (JP) 2020-12-31 US disclosed
US-20200407477-A1 POLYMER, POSITIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN ZEON CORPORATION (JP) 2020-12-31 US disclosed
EP-3751345-A1 RESIST COMPOSITION AND RESIST FILM Zeon Corporation (JP) 2020-12-16 EP disclosed
WO-2019181582-A1 POLYMER, POSITIVE RESIST COMPOSITION, AND METHOD FOR FORMING RESIST PATTERN 日本ゼオン株式会社 2019-09-26 WO disclosed