SCHEMBL214611

SCHEMBL214611

C=C(C)C(=O)OC1C2CC3CC(C2)CC1(CC(CC)OC)C3

nearest known ligand 0.32

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.32
KMT2A Q03164 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL453582 0.85 EPHX2 (0.31) ALDH1A1KMT2A
SCHEMBL216846 0.83 ALDH1A1 (0.32) ALDH1A1KMT2ASMN1; SMN2
SCHEMBL3053351 0.80 MEN1 (0.33) ALDH1A1KMT2A
SCHEMBL3057478 0.78 TSHR (0.35) ALDH1A1KMT2A
SCHEMBL19052008 0.77 ALDH1A1 (0.31) ALDH1A1
SCHEMBL3058365 0.75 ALDH1A1 (0.30) ALDH1A1
SCHEMBL12346676 0.73 ALDH1A1 (0.33) ALDH1A1
SCHEMBL108706 0.72 ALDH1A1 (0.33) ALDH1A1
SCHEMBL450766 0.72 ALDH1A1 (0.31) ALDH1A1
SCHEMBL6749784 0.72 EPHX2 (0.30) ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 55 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250189896-A1 RESIST UNDERLAYER FILM FORMATION COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2025-06-12 US disclosed
US-20250136734-A1 PROTECTIVE-FILM FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2025-05-01 US disclosed
CN-118742856-A Composition for forming protective film 日产化学株式会社 2024-10-01 CN disclosed
WO-2023162653-A1 RESIST UNDERLAYER FILM FORMATION COMPOSITION 日産化学株式会社 2023-08-31 WO disclosed
WO-2023157772-A1 PROTECTIVE FILM FORMING COMPOSITION 日産化学株式会社 2023-08-24 WO disclosed
US-11592747-B2 Resist underlayer film-forming composition comprising carbonyl-containing polyhydroxy aromatic ring novolac resin NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2023-02-28 US disclosed
US-11199777-B2 Resist underlayer film-forming composition containing novolac polymer having secondary amino group NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2021-12-14 US disclosed
CN-104412163-B Method for manufacturing semiconductor device using composition for forming organic underlayer film for solvent development lithography process 日产化学工业株式会社 2020-05-22 CN disclosed
CN-104067175-B Composition for forming resist underlayer film containing copolymer resin having heterocycle 日产化学工业株式会社 2018-01-02 CN disclosed
CN-103635858-B Resist underlayer film forming composition containing alicyclic skeleton-containing carbazole resin 日产化学工业株式会社 2017-09-29 CN disclosed
US-20090311624-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION CONTAINING LIQUID ADDITIVE NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2009-12-17 US disclosed
US-20080102649-A1 Underlayer Coating Forming Composition For Lythography Containing Compound Having Protected Carboxyl Group NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2008-05-01 US disclosed
EP-1850180-A1 COMPOSITION FOR FORMING OF UNDERLAYER FILM FOR LITHOGRAPHY THAT CONTAINS COMPOUND HAVING PROTECTED CARBOXYL Nissan Chemical Industries, Ltd. (JP) 2007-10-31 EP disclosed
US-20070238029-A1 Underlayer Coating Forming Composition for Lithography Containing Naphthalene Ring Having Halogen Atom NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2007-10-11 US disclosed
US-7226721-B2 Underlayer coating forming composition for lithography containing compound having protected carboxyl group NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2007-06-05 US disclosed
EP-1780600-A1 LOWER LAYER FILM FORMING COMPOSITION FOR LITHOGRAPHY INCLUDING NAPHTHALENE RING HAVING HALOGEN ATOM Nissan Chemical Industries, Ltd. (JP) 2007-05-02 EP disclosed
US-20060234156-A1 Composition for formation of underlayer film for lithography containing epoxy compound and carboxylic acid compound NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2006-10-19 US disclosed
US-20060210915-A1 Composition for forming lower layer film for lithography comprising compound having protected carboxyl group NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2006-09-21 US disclosed
EP-1662769-A1 COMPOSITION FOR FORMING LOWER LAYER FILM FOR LITHOGRAPHY COMPRISING COMPOUND HAVING PROTECTED CARBOXYL GROUP Nissan Chemical Industries, Ltd. (JP) 2006-05-31 EP disclosed
EP-1617289-A1 COMPOSITION FOR FORMATION OF UNDERLAYER FILM FOR LITHOGRAPHY CONTAINING EPOXY COMPOUND AND CARBOXYLIC ACID COMPOUND Nissan Chemical Industries, Ltd. (JP) 2006-01-18 EP disclosed