SCHEMBL21910752

SCHEMBL21910752

COC(=O)C1C2CC3C(OC(=O)C31)C2N

nearest known ligand 0.34

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 4/20 0.34
MEN1 O00255 1/20 0.34
L3MBTL1 Q9Y468 1/20 0.33
ALDH1A1 P00352 2/20 0.32
GLA P06280 1/20 0.32
HPGD P15428 1/20 0.32
HTT P42858 1/20 0.32
PPM1B O75688 1/20 0.32
PTPN1 P18031 1/20 0.32
PPP1CC P36873 1/20 0.32
NPC1 O15118 1/20 0.31
TP53 P04637 1/20 0.31
RAB9A P51151 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
KDM4E B2RXH2 1/20 0.30
NPSR1 Q6W5P4 1/20 0.30
POLB P06746 1/20 0.30
CYP2D6 P10635 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17320482 0.86 KMT2A (0.36) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL3414738 0.83 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL22855676 0.83 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL14001998 0.83 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL12014001 0.83 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL962818 0.83 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL11988730 0.83 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL21567775 0.82 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL8580888 0.82 KMT2A (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL13481221 0.82 ALDH1A1 (0.34) KMT2AMEN1L3MBTL1ALDH1A1GLA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2024135498-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND COMPOUND 東京応化工業株式会社 2024-06-27 WO disclosed
WO-2024127977-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, COMPOUND, AND ACID DIFFUSION CONTROL AGENT 東京応化工業株式会社 2024-06-20 WO disclosed
WO-2024122425-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, COMPOUND, AND ACID DIFFUSION CONTROL AGENT 東京応化工業株式会社 2024-06-13 WO disclosed
WO-2024043098-A1 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, COMPOUND, AND INTERMEDIATE THEREOF 東京応化工業株式会社 2024-02-29 WO disclosed
WO-2024043121-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND COMPOUND AND INTERMEDIATE THEREFOR 東京応化工業株式会社 2024-02-29 WO disclosed
WO-2023223897-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND COMPOUND 東京応化工業株式会社 2023-11-23 WO disclosed
WO-2023210520-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND COMPOUND 東京応化工業株式会社 2023-11-02 WO disclosed
WO-2023195407-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-10-12 WO disclosed
WO-2023189961-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-10-05 WO disclosed
WO-2023176546-A1 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, COMPOUND, AND ACID GENERATOR 東京応化工業株式会社 2023-09-21 WO disclosed
WO-2023140231-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND COMPOUND 東京応化工業株式会社 2023-07-27 WO disclosed
WO-2023140364-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, COMPOUND, AND POLYMER 東京応化工業株式会社 2023-07-27 WO disclosed
WO-2023112893-A1 RESIST COMPOSITION AND RESIST PATTERN FORMATION METHOD 東京応化工業株式会社 2023-06-22 WO disclosed
WO-2023068333-A1 METHOD FOR PRODUCING ACID GENERATOR 東京応化工業株式会社 2023-04-27 WO disclosed
WO-2023013592-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2023-02-09 WO disclosed
WO-2022270627-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2022-12-29 WO disclosed
WO-2022265034-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, METHOD FOR PRODUCING COMPOUNDS, INTERMEDIATE, AND COMPOUNDS 東京応化工業株式会社 2022-12-22 WO disclosed
WO-2022264941-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2022-12-22 WO disclosed
WO-2022264845-A1 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN 東京応化工業株式会社 2022-12-22 WO disclosed
WO-2020054563-A1 RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD 東京応化工業株式会社 2020-03-19 WO disclosed