SCHEMBL962818

SCHEMBL962818

COC(=O)C1C2CC3C(OC(=O)C31)C2O

nearest known ligand 0.34

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 4/20 0.34
MEN1 O00255 1/20 0.34
CYP2C19 P33261 1/20 0.34
L3MBTL1 Q9Y468 1/20 0.34
ALDH1A1 P00352 2/20 0.33
GLA P06280 1/20 0.33
HPGD P15428 1/20 0.33
HTT P42858 1/20 0.33
PPM1B O75688 1/20 0.33
PTPN1 P18031 1/20 0.33
PPP1CC P36873 1/20 0.33
NPC1 O15118 2/20 0.32
SMN1; SMN2 Q16637 2/20 0.32
TP53 P04637 1/20 0.32
RAB9A P51151 1/20 0.32
POLB P06746 1/20 0.31
CYP2D6 P10635 1/20 0.31
SLC6A4 P31645 1/20 0.30
SLC6A3 Q01959 1/20 0.30
MAPT P10636 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12009861 0.88 PPM1B (0.36) KMT2AMEN1CYP2C19L3MBTL1PPM1B
SCHEMBL17320482 0.87 KMT2A (0.36) KMT2AMEN1L3MBTL1ALDH1A1GLA
SCHEMBL12920508 0.86 KMT2A (0.35) KMT2AMEN1ALDH1A1GLAHPGD
SCHEMBL961077 0.85 MAPK1 (0.32)
SCHEMBL963171 0.85 KMT2A (0.38) KMT2AMEN1CYP2C19ALDH1A1HPGD
SCHEMBL961753 0.85 KMT2A (0.35) KMT2AMEN1ALDH1A1GLAHPGD
SCHEMBL14001998 0.84 KMT2A (0.34) KMT2AMEN1CYP2C19L3MBTL1ALDH1A1
SCHEMBL22855676 0.84 KMT2A (0.34) KMT2AMEN1CYP2C19L3MBTL1ALDH1A1
SCHEMBL3414738 0.84 KMT2A (0.34) KMT2AMEN1CYP2C19L3MBTL1ALDH1A1
SCHEMBL12014001 0.84 KMT2A (0.34) KMT2AMEN1CYP2C19L3MBTL1ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 72 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12517429-B2 Radiation-sensitive resin composition and method for forming pattern JSR CORPORATION (JP) 2026-01-06 US disclosed
US-20250377590-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING RESIST PATTERN JSR CORPORATION (JP) 2025-12-11 US disclosed
US-20250321484-A1 METHOD FOR FORMING RESIST PATTERN AND RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2025-10-16 US disclosed
US-12422748-B2 Radiation-sensitive resin composition and method for forming resist pattern JSR CORPORATION (JP) 2025-09-23 US disclosed
US-12372869-B2 Method for forming resist pattern and radiation-sensitive resin composition JSR CORPORATION (JP) 2025-07-29 US disclosed
US-12265331-B2 Radiation-sensitive resin composition and method for forming resist pattern JSR CORPORATION (JP) 2025-04-01 US disclosed
US-12092957-B2 Radiation-sensitive resin composition, method for forming resist pattern and compound JSR CORPORATION (JP) 2024-09-17 US disclosed
US-11966160-B2 Radiation-sensitive resin composition and method for forming pattern JSR CORPORATION (JP) 2024-04-23 US disclosed
US-20230393469-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER, AND COMPOUND JSR CORPORATION (JP) 2023-12-07 US disclosed
US-20230341772-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING RESIST PATTERN JSR CORPORATION (JP) 2023-10-26 US disclosed
US-20090233242-A1 LACTONE-CONTAINING COMPOUND, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-09-17 US disclosed
US-20090233242-A1 LACTONE-CONTAINING COMPOUND, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-09-17 US disclosed
EP-2100887-A1 Lactone-containing compound, polymer, resist composition, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2009-09-16 EP disclosed
EP-2100887-A1 Lactone-containing compound, polymer, resist composition, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2009-09-16 EP disclosed
US-20090208871-A1 NOVEL COMPOUND AND METHOD OF PRODUCING SAME, ACID GENERATOR, RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-20 US disclosed
US-20090208871-A1 NOVEL COMPOUND AND METHOD OF PRODUCING SAME, ACID GENERATOR, RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-20 US disclosed
EP-1903395-A1 Positive photosensitive composition, polymer compounds for use in the positive photosensitive composition, manufacturing method of the polymer compounds, compounds for use in the manufacture of the polymer compounds, and pattern-forming method using the positive photosensitive composition FUJIFILM Corporation (JP) 2008-03-26 EP disclosed
US-20080026331-A1 Lactone-containing compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-01-31 US disclosed
US-20080026331-A1 Lactone-containing compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-01-31 US disclosed
US-20080026331-A1 Lactone-containing compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-01-31 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (7 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20230341772-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING RESIST PATTERN RER1, XRCC5, F12 KMT2A 1428/4885MEN1 1944/4885CYP2C19 3685/4885
US-20230393469-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER, AND COMPOUND RER1, RAD51, RFT1 KMT2A 1233/4885MEN1 1250/4885CYP2C19 2253/4885
US-20090233242-A1 LACTONE-CONTAINING COMPOUND, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS WDR5, RER1, H1-5 KMT2A 472/4885MEN1 466/4885CYP2C19 2097/4885
US-12422748-B2 Radiation-sensitive resin composition and method for forming resist pattern RER1, XRCC5, F12 KMT2A 1421/4885MEN1 1938/4885CYP2C19 3722/4885
US-20090208871-A1 NOVEL COMPOUND AND METHOD OF PRODUCING SAME, ACID GENERATOR, RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN COASY, SLC11A2, AKR7A2 KMT2A 2640/4885MEN1 181/4885CYP2C19 700/4885
US-12092957-B2 Radiation-sensitive resin composition, method for forming resist pattern and compound RER1, RFT1, RAD51 KMT2A 1269/4885MEN1 2363/4885CYP2C19 3318/4885
US-20250377590-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING RESIST PATTERN RER1, RAD51, RFC2 KMT2A 1322/4885MEN1 2526/4885CYP2C19 2736/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.