SCHEMBL221560

SCHEMBL221560

C=C(CCCOC(C)(C)C)C(=O)O

nearest known ligand 0.39

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
TET2 Q6N021 1/20 0.39
TBXAS1 P24557 2/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4141826 0.88 TET2 (0.42) TET2
SCHEMBL2115995 0.79 TET2 (0.33) TET2
SCHEMBL2311055 0.79 ALDH1A1 (0.46)
SCHEMBL28694979 0.79 TET2 (0.45) TET2
SCHEMBL156151 0.77 ALDH1A1 (0.50) TET2TBXAS1
SCHEMBL2113358 0.77 TET2 (0.32) TET2
SCHEMBL11126565 0.76 TSHR (0.39) TET2TBXAS1
SCHEMBL4087831 0.74 EPHX2 (0.38) TET2TBXAS1
SCHEMBL1007351 0.74 TBXAS1 (0.36) TET2TBXAS1
SCHEMBL7097731 0.74 SOAT1 (0.33)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 14 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9733564-B2 Copolymers for lithography and method for producing same, resist composition, method for producing substrate with pattern formed thereupon, method for evaluating copolymers, and method for analyzing copolymer compositions MITSUBISHI CHEMICAL CORPORATION (JP) 2017-08-15 US disclosed
US-20130224654-A1 COPOLYMERS FOR LITHOGRAPHY AND METHOD FOR PRODUCING SAME, RESIST COMPOSITION, METHOD FOR PRODUCING SUBSTRATE WITH PATTERN FORMED THEREUPON, METHOD FOR EVALUATING COPOLYMERS, AND METHOD FOR ANALYZING COPOLYMER COMPOSITIONS MITSUBISHI RAYON CO., LTD. (JP) 2013-08-29 US disclosed
US-8241829-B2 Resist polymer, resist composition, process for pattern formation, and starting compounds for production of the resist polymer MITSUBISHI RAYON CO., LTD. (JP) 2012-08-14 US disclosed
US-8114949-B2 (Meth)acrylate, polymer and resist composition MITSUBISHI RAYON CO., LTD. (JP) 2012-02-14 US disclosed
US-8092979-B2 Resist polymer and resist composition MITSUBISHI RAYON CO., LTD. (JP) 2012-01-10 US disclosed
US-8088875-B2 (Meth)acrylate, polymer and resist composition MITSUBISHI RAYON CO., LTD. (JP) 2012-01-03 US disclosed
US-20090130419-A1 FOAM SHEET AND PRODUCTION PROCESS THEREOF OJI PAPER CO., LTD (JP) 2009-05-21 US disclosed
US-20080070998-A1 Foam Production Method OJI PAPER CO., LTD. (JP) 2008-03-20 US disclosed
US-20080003529-A1 (Meth)Acrylate, Polymer and Resist Composition MITSUBISHI RAYON CO., LTD. (JP) 2008-01-03 US disclosed
US-20070190449-A1 Resist polymer, resist composition, process for pattern formation, and starting compounds for production of the resist polymer MITSUBISHI RAYON CO., LTD. (JP) 2007-08-16 US disclosed
EP-1795553-A1 PROCESS FOR PRODUCING FOAM Oji Paper Co., Ltd. (JP) 2007-06-13 EP disclosed
US-20060210785-A1 Foamed product in a sheet form and method for production thereof OJI PAPER CO., LTD. (JP) 2006-09-21 US disclosed
EP-1647570-A1 FOAMED PRODUCT IN A SHEET FORM AND METHOD FOR PRODUCTION THEREOF Oji Paper Co., Ltd. (JP) 2006-04-19 EP disclosed
US-6706826-B1 COMONOMERS COMPRISING ALICYCLIC AND LACTONE STRUCTURES; HYDROPHOBIC AND HEAT RESISTANCE, SOLVENT SOLUBILITY; PAINTS MITSUBISHI RAYON CO., LTD. (JP) 2004-03-16 US disclosed