SCHEMBL245789

SCHEMBL245789

C[S+](C)c1ccc(O)cc1

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CYP3A4 P08684 5/20 0.50
HSD17B10 Q99714 5/20 0.50
ALOX15 P16050 5/20 0.50
LMNA P02545 4/20 0.50
HIF1A Q16665 4/20 0.50
MEN1 O00255 4/20 0.50
KMT2A Q03164 4/20 0.50
ALDH1A1 P00352 3/20 0.50
MAPT P10636 3/20 0.50
TYR P14679 2/20 0.50
HPGD P15428 2/20 0.50
CA3 P07451 2/20 0.50
CA14 Q9ULX7 2/20 0.50
KDM4E B2RXH2 1/20 0.50
NPC1 O15118 1/20 0.50
CA12 O43570 1/20 0.50
GMNN O75496 1/20 0.50
CA1 P00915 1/20 0.50
CA2 P00918 1/20 0.50
NFKB1 P19838 1/20 0.50

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Hydrochloric Acid SCHEMBL11662665 0.97 CYP3A4 (0.47) CYP3A4HSD17B10ALOX15LMNAHIF1A
SCHEMBL30217812 0.89 CYP3A4 (0.40) CYP3A4HSD17B10ALOX15LMNAHIF1A
Perchlorate SCHEMBL9574136 0.89 LMNA (0.40) CYP3A4HSD17B10ALOX15LMNAHIF1A
SCHEMBL29843423 0.89 CYP3A4 (0.40) CYP3A4HSD17B10ALOX15LMNAHIF1A
Sulfuric Acid SCHEMBL3625676 0.87 HPGD (0.50) CYP3A4HSD17B10ALOX15LMNAHIF1A
Sulfuric Acid SCHEMBL3625673 0.85 ENPP2 (0.48) CYP3A4HSD17B10ALOX15LMNAHIF1A
SCHEMBL29714721 0.83 ENPP2 (0.52) CYP3A4HSD17B10ALOX15LMNAHIF1A
Sulfuric Acid SCHEMBL3625678 0.83 LMNA (0.48) CYP3A4HSD17B10ALOX15LMNAHIF1A
SCHEMBL9336595 0.82 ENPP2 (0.35) CYP3A4HSD17B10ALOX15LMNAHIF1A
SCHEMBL12934400 0.81 CYP3A4 (0.50) CYP3A4HSD17B10ALOX15LMNAHIF1A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1323 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4607278-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT Ycchem Co., Ltd. (KR) 2025-08-27 EP claimed
US-20250199405-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT YCCHEM CO., LTD. (KR) 2025-06-19 US claimed
CN-119998727-A Chemically amplified positive resist composition for improving pattern profile and enhancing etch resistance YC化学制品株式会社 2025-05-13 CN claimed
WO-2024085293-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT 영창케미칼 주식회사 2024-04-25 WO claimed
US-20180031912-A1 METHODS OF FABRICATING QUANTUM DOT COLOR FILM SUBSTRATES SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO. 2018-02-01 US claimed
US-9075306-B2 Chemically amplified negative resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-07 US claimed
EP-1710230-B1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2013-08-14 EP claimed
CN-101034260-B Photosensitive resin composition DONGJIN SEMICOHEM CO LTD 2012-07-18 CN claimed
EP-1780199-B1 Novel fluorohydroxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2012-02-01 EP claimed
EP-1780198-B1 Novel fluorosulfonyloxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2011-10-05 EP claimed
US-6991888-B2 Photoresist composition for deep ultraviolet lithography comprising a mixture of photoactive compounds AZ ELECTRONIC MATERIALS USA CORP. (US) 2006-01-31 US claimed
EP-1516229-A2 PHOTORESIST COMPOSITION FOR DEEP ULTRAVIOLET LITHOGRAPHY COMPRISING A MIXTURE OF PHOTOACTIVE COMPOUNDS AZ Electronic Materials USA Corp. (US) 2005-03-23 EP claimed
US-20030235782-A1 Photoresist composition for deep ultraviolet lithography comprising a mixture of photoactive compounds MERCK PATENT GMBH (DE) 2003-12-25 US claimed
US-20030235775-A1 Photoresist composition for deep ultraviolet lithography comprising a mixture of photoactive compounds CLARIANT INTERNATIONAL LTD (CH) 2003-12-25 US claimed
WO-2003107093-A2 PHOTORESIST COMPOSITION FOR DEEP ULTRAVIOLET LITHOGRAPHY COMPRISING A MIXTURE OF PHOTOACTIVE COMPOUNDS CLARIANT INTERNATIONAL LTD (CH) 2003-12-24 WO claimed
US-6440634-B1 MICROFABRICATION OF INTEGRATED CIRCUITS, DEEP UV LITHOGRAPHY; PHENYLSULFONATE SALTS OF SULFONIUM OR IODINIUM CATIONS SHIN-ETSU CHEMICAL CO., LTD (JP) 2002-08-27 US claimed
EP-0346756-B1 PROCESS FOR PRODUCTION OF SULFONIUM COMPOUNDS MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 1992-10-28 EP claimed
EP-0245662-B1 P-HYDROXYPHENYLSULFONIUM SALTS AND THEIR USE IN THE PREPARATION OF ESTERS AND AMIDES SANSHIN KAGAKU KOGYO CO., LTD. (JP) 1991-08-07 EP claimed
EP-0331988-A1 Sulfonium compounds, as well as process for producing active esters and amides used for the production of amides SANSHIN KAGAKU KOGYO CO., LTD. (JP) 1989-09-13 EP claimed
EP-0245662-A1 p-Hydroxyphenylsulfonium salts and their use in the preparation of esters and amides SANSHIN KAGAKU KOGYO CO., LTD. (JP) 1987-11-19 EP claimed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20030235782-A1 Photoresist composition for deep ultraviolet lithography comprising a mixture of photoactive compounds SUN2, UROD, ERCC1 CYP3A4 2464/4885HSD17B10 3170/4885ALOX15 930/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.