SCHEMBL2520038

SCHEMBL2520038

CCCc1cccc([SiH2]O)c1C

nearest known ligand 0.35

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
DAO P14920 1/20 0.35
GABRA1 P14867 2/20 0.34
GABRB2 P47870 2/20 0.34
GRM5 P41594 1/20 0.33
PDCD1 Q15116 1/20 0.32
CD274 Q9NZQ7 1/20 0.32
ALOX5 P09917 1/20 0.31
PTGS2 P35354 1/20 0.31
IAPP P10997 1/20 0.31
ESR1 P03372 1/20 0.31
ESR2 Q92731 1/20 0.31
LIPG Q9Y5X9 1/20 0.31
ALDH1A1 P00352 1/20 0.30
ELANE P08246 1/20 0.30
CTSG P08311 1/20 0.30
HTR1A P08908 1/20 0.30
SLC6A2 P23975 1/20 0.30
SLC6A4 P31645 1/20 0.30
SLC6A3 Q01959 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2524117 0.89 CYP3A4 (0.41) ALOX5PTGS2IAPPLIPGELANE
SCHEMBL2522784 0.84 GABRA1 (0.46) DAOGABRA1GABRB2PDCD1CD274
SCHEMBL1918471 0.82 HTR1A (0.40) DAOGABRA1GABRB2LIPGHTR1A
SCHEMBL3482133 0.81 DAO (0.35) DAOGABRA1GABRB2GRM5ALOX5
SCHEMBL9839945 0.77 GRM5 (0.40) DAOGABRA1GABRB2GRM5PDCD1
SCHEMBL2522528 0.76 GABRA1 (0.52) GABRA1GABRB2PDCD1CD274ESR1
SCHEMBL2522716 0.76 GABRA1 (0.42) DAOGABRA1GABRB2IAPPALDH1A1
Hydrogen Peroxide SCHEMBL28094650 0.75 ESR1 (0.46) DAOGABRA1GABRB2GRM5PDCD1
SCHEMBL29407427 0.74 ESR1 (0.44) DAOGABRA1GABRB2GRM5ESR1
SCHEMBL599914 0.74 ESR1 (0.44) DAOGABRA1GABRB2GRM5ESR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-113168101-B Photosensitive resin composition, method for producing pattern cured film, interlayer insulating film, coverlay, surface protective film, and electronic component 艾曲迪微系统股份有限公司 2025-02-18 CN disclosed
CN-113168102-B Photosensitive resin composition, method for producing pattern cured product, interlayer insulating film, coverlay, surface protective film, and electronic component 艾曲迪微系统股份有限公司 2024-11-19 CN disclosed
CN-114502617-B Polyimide precursor, photosensitive resin composition, interlayer insulating film, covercoat, surface protective film, and electronic component 艾曲迪微系统股份有限公司 2024-05-03 CN disclosed
CN-116710498-A Polyimide precursor resin composition and method for producing same 旭化成株式会社 2023-09-05 CN disclosed
CN-113820920-B Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2023-07-04 CN disclosed
US-9786576-B2 Positive-type photosensitive resin composition, method for production of resist pattern, semiconductor device, and electronic device HITACHI CHEMICAL COMPANY, LTD (JP) 2017-10-10 US disclosed
US-20170165879-A1 RESIN PRECURSOR, RESIN COMPOSITION CONTAINING SAME, POLYIMIDE RESIN MEMBRANE, RESIN FILM, AND METHOD FOR PRODUCING SAME ASAHI KASEI KABUSHIKI KAISHA (JP) 2017-06-15 US disclosed
US-9274422-B2 Photosensitive resin composition, method for forming pattern-cured film using photosensitive resin composition, and electronic component HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2016-03-01 US disclosed
US-20140120462-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN-CURED FILM USING PHOTOSENSITIVE RESIN COMPOSITION, AND ELECTRONIC COMPONENT HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2014-05-01 US disclosed
EP-2221666-B1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCTION OF RESIST PATTERN, AND SEMICONDUCTOR DEVICE HITACHI CHEMICAL CO LTD (JP) 2013-09-18 EP disclosed
US-20110250396-A1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCTION OF RESIST PATTERN, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE RESONAC CORPORATION (JP) 2011-10-13 US disclosed
EP-2221666-A1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCTION OF RESIST PATTERN, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE Hitachi Chemical Company, Ltd. (JP) 2010-08-25 EP disclosed
US-20100159217-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERNS, AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD (JP) 2010-06-24 US disclosed