SCHEMBL25564202

SCHEMBL25564202

CC(=O)OC1(c2ccc(C(F)(F)F)cc2)CC(C)C(C)C1

nearest known ligand 0.41

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
MAOA P21397 2/20 0.41
MAOB P27338 2/20 0.41
KDM1A O60341 1/20 0.41
PDE2A O00408 2/20 0.37
BACE1 P56817 1/20 0.36
CES2 O00748 1/20 0.36
CES1 P23141 1/20 0.36
NR4A1 P22736 1/20 0.36
NR4A2 P43354 1/20 0.36
NR4A3 Q92570 1/20 0.36
KDM4E B2RXH2 1/20 0.35
USP2 O75604 1/20 0.35
ALDH1A1 P00352 1/20 0.35
HPGD P15428 1/20 0.35
CYP2C19 P33261 1/20 0.35
HSD17B10 Q99714 1/20 0.35
OPRM1 P35372 1/20 0.35
OPRL1 P41146 1/20 0.35
HTT P42858 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25564206 0.85 CCR1 (0.41) MAOAMAOBKDM1ABACE1KDM4E
SCHEMBL25564203 0.85 SLC6A4 (0.39) MAOAMAOBKDM1APDE2ABACE1
SCHEMBL25564201 0.83 DRD2 (0.43) MAOAMAOBALDH1A1CYP2C19
SCHEMBL25564211 0.83 SLC6A4 (0.40) KDM1ABACE1
SCHEMBL25564144 0.82 SLC6A3 (0.43) MAOAMAOBKDM1APDE2ABACE1
SCHEMBL25564245 0.81 SLC6A3 (0.46) PDE2ABACE1CES2CES1NR4A1
SCHEMBL25564207 0.77 OPRM1 (0.36) MAOAMAOBKDM1APDE2ABACE1
SCHEMBL24616712 0.73 NR4A1 (0.37) MAOAMAOBKDM1APDE2ANR4A1
SCHEMBL26983300 0.73 NR4A1 (0.37) MAOAMAOBKDM1APDE2ANR4A1
SCHEMBL24397826 0.71 OPRM1 (0.37) MAOAMAOBKDM1APDE2AOPRM1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed