SCHEMBL25564211

SCHEMBL25564211

CC(=O)OC1(c2ccc(OC(F)(F)F)cc2)CC(C)C(C)C1

nearest known ligand 0.40

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
SLC6A4 P31645 10/20 0.40
EPHX2 P34913 8/20 0.40
SLC6A3 Q01959 7/20 0.40
SLC6A2 P23975 1/20 0.38
CTSD P07339 1/20 0.37
BACE1 P56817 1/20 0.37
BACE2 Q9Y5Z0 1/20 0.37
KDM1A O60341 1/20 0.37
RCOR1 Q9UKL0 1/20 0.37
EPHX1 P07099 1/20 0.37
FAAH O00519 1/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25564205 0.85 SLC6A4 (0.43) SLC6A4EPHX2SLC6A3SLC6A2KDM1A
SCHEMBL25564221 0.85 SLC6A4 (0.43) SLC6A4EPHX2SLC6A3SLC6A2EPHX1
SCHEMBL25564202 0.83 MAOA (0.41) BACE1KDM1A
SCHEMBL25564148 0.83 SLC6A4 (0.49) SLC6A4EPHX2SLC6A3SLC6A2
SCHEMBL25564249 0.82 SLC6A4 (0.51) SLC6A4EPHX2SLC6A3SLC6A2EPHX1
SCHEMBL25564201 0.81 DRD2 (0.43) SLC6A3SLC6A2
SCHEMBL25564209 0.78 SLC6A4 (0.43) SLC6A4EPHX2SLC6A3SLC6A2
SCHEMBL25564229 0.72 ADORA3 (0.39) SLC6A4SLC6A3SLC6A2
SCHEMBL31169161 0.71 EPHX2 (0.44) SLC6A4EPHX2SLC6A3SLC6A2KDM1A
SCHEMBL25564288 0.71 ADORA3 (0.40) SLC6A4SLC6A3SLC6A2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed