SCHEMBL25564243

SCHEMBL25564243

CC(=O)OC1(c2cccc(C(F)(F)F)c2)CCCCC1

nearest known ligand 0.54

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
SLC6A4 P31645 3/20 0.50
SLC6A3 Q01959 2/20 0.50
SLC6A2 P23975 1/20 0.50
CCR2 P41597 2/20 0.48
OPRM1 P35372 3/20 0.43
OPRL1 P41146 3/20 0.43
NPSR1 Q6W5P4 1/20 0.42
KDM1A O60341 2/20 0.41
OPRK1 P41145 1/20 0.41
POLB P06746 2/20 0.41
LMNA P02545 2/20 0.41
HPGD P15428 1/20 0.41
HCAR3 P49019 1/20 0.41
HCAR2 Q8TDS4 1/20 0.41
TP53 P04637 1/20 0.41
MAPT P10636 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25564143 0.99 CCR2 (0.49) SLC6A4SLC6A3SLC6A2CCR2OPRM1
SCHEMBL25564297 0.87 CCR2 (0.40) SLC6A4SLC6A3SLC6A2CCR2OPRM1
SCHEMBL25564255 0.86 CCR2 (0.37) SLC6A4SLC6A3SLC6A2CCR2HPGD
SCHEMBL25564226 0.86 CCR2 (0.40) SLC6A4SLC6A3SLC6A2CCR2OPRM1
Hydrochloric Acid SCHEMBL27626949 0.86 CCR2 (0.46) SLC6A4SLC6A3SLC6A2CCR2OPRM1
SCHEMBL25564150 0.84 CCR2 (0.38) CCR2HPGDMAPT
SCHEMBL25564245 0.83 SLC6A3 (0.46) SLC6A4SLC6A3SLC6A2OPRM1OPRL1
SCHEMBL25564306 0.82 SLC6A4 (0.47) SLC6A4SLC6A3SLC6A2CCR2OPRM1
SCHEMBL25564238 0.82 SLC6A4 (0.47) SLC6A4SLC6A3SLC6A2CCR2OPRM1
SCHEMBL25564318 0.82 SLC6A4 (0.47) SLC6A4SLC6A3SLC6A2CCR2OPRM1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed