SCHEMBL2734982

SCHEMBL2734982

CCC(C)(C)C(=O)OCC(=O)OCOC1CCCCC1

nearest known ligand 0.37

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
HMGCR P04035 2/20 0.37
NAAA Q02083 2/20 0.35
FKBP1A P62942 5/20 0.34
EPHX1 P07099 1/20 0.34
KMT2A Q03164 2/20 0.33
EPHX2 P34913 1/20 0.32
MEN1 O00255 1/20 0.32
MAPT P10636 1/20 0.32
ATM Q13315 1/20 0.32
CYP19A1 P11511 1/20 0.31
HTT P42858 1/20 0.31
CCR2 P41597 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16591000 0.99 HMGCR (0.36) HMGCRNAAAFKBP1AEPHX1KMT2A
SCHEMBL47512 0.91 HMGCR (0.40) HMGCRNAAAFKBP1AEPHX1EPHX2
SCHEMBL47408 0.91 HMGCR (0.40) HMGCRNAAAFKBP1AEPHX1EPHX2
SCHEMBL47524 0.89 HMGCR (0.40) HMGCRNAAAFKBP1AEPHX1CYP19A1
SCHEMBL9916134 0.85 NAAA (0.46) HMGCRNAAAFKBP1AEPHX1EPHX2
SCHEMBL9916136 0.83 NAAA (0.45) HMGCRNAAAFKBP1AEPHX1CYP19A1
SCHEMBL10260297 0.81 FKBP1A (0.36) HMGCRNAAAFKBP1AEPHX1CYP19A1
SCHEMBL10260305 0.80 FKBP1A (0.40) HMGCRNAAAFKBP1AEPHX1
SCHEMBL2734960 0.80 FKBP1A (0.38) HMGCRFKBP1AEPHX1
SCHEMBL16591088 0.78 FKBP1A (0.36) HMGCRNAAAFKBP1AEPHX1EPHX2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11640113-B2 Actinic ray-sensitive or radiation-sensitive resin composition, pattern forming method, and method of manufacturing electronic device FUJIFILM CORPORATION (JP) 2023-05-02 US disclosed
US-20170121437-A1 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, ELECTRONIC DEVICE, ACTIVE-LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM AND MASK BLANK FUJIFILM CORPORATION (JP) 2017-05-04 US disclosed
US-20160195814-A1 PATTERN FORMATION METHOD, ELECTRONIC-DEVICE PRODUCTION METHOD, AND PROCESSING AGENT FUJIFILM CORPORATION (JP) 2016-07-07 US disclosed
US-20150086912-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM AND PATTERN FORMING METHOD USING THE SAME, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2015-03-26 US disclosed
US-8088550-B2 Positive resist composition and pattern forming method FUJIFILM CORPORATION (JP) 2012-01-03 US disclosed
US-20090035692-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING MEHTOD FUJIFILM CORPORATION (JP) 2009-02-05 US disclosed
US-20090023096-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD FUJIFILM CORPORATION (JP) 2009-01-22 US disclosed