SCHEMBL2821700

SCHEMBL2821700

CCCCC(C)c1cccc2[nH]nnc12

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9225082 0.94 GPR84 (0.34)
SCHEMBL24981149 0.94 GPR84 (0.34)
SCHEMBL9222918 0.84 TSHR (0.42)
SCHEMBL10689879 0.84 CYSLTR2 (0.32)
SCHEMBL9228342 0.83 CYSLTR2 (0.36)
SCHEMBL28403192 0.82 CYSLTR2 (0.35)
SCHEMBL27635807 0.78 FFAR1 (0.33)
SCHEMBL2611045 0.77 GABRA1 (0.39)
SCHEMBL11151068 0.77 CYP1A2 (0.30)
SCHEMBL8208195 0.74 P2RX7 (0.34)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 149 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260042976-A1 COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM ELECTRONIC MAT USA INC (US) 2026-02-12 US claimed
EP-4381022-A1 COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM Electronic Materials U.S.A., Inc. (US) 2024-06-12 EP claimed
US-20240034958-A1 COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2024-02-01 US claimed
US-20230052829-A1 COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. 2023-02-16 US claimed
WO-2023014565-A1 COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2023-02-09 WO claimed
CN-106460196-A Etching composition 富士胶片电子材料美国有限公司 2017-02-22 CN claimed
CN-105849245-A Cleaning formulations for removing residues on surfaces 富士胶片电子材料美国有限公司 2016-08-10 CN claimed
CN-102318042-B Polishing agent for polishing copper and polishing method using same HITACHI CHEMICAL CO LTD 2015-07-01 CN claimed
CN-100543124-C Substrate is with clean-out system and purging method WAKO PURE CHEM IND LTD (JP) 2009-09-23 CN claimed
CN-1902291-A Polishing composition and polishing method SHOWA DENKO KK (JP) 2007-01-24 CN claimed
EP-4743526-A2 POLISHING COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM Electronic Materials U.S.A, Inc. (US) 2026-05-20 EP disclosed
US-12630744-B2 Polishing compositions and methods of use thereof FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2026-05-19 US disclosed
US-20260117105-A1 POLISHING COMPOSITION HAVING EXCELLENT STORAGE STABILITY AND METHOD FOR PRODUCING SAME NISSAN CHEMICAL CORPORATION (JP) 2026-04-30 US disclosed
US-20260042976-A1 COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM ELECTRONIC MAT USA INC (US) 2026-02-12 US disclosed
EP-4688987-A1 POLISHING COMPOSITIONS AND METHODS OF USE THEREOF FUJIFILM Electronic Materials U.S.A, Inc. (US) 2026-02-11 EP disclosed
CN-1122655-C improved metal-ligand complex catalyzed processes UNION CARBIDE CHEM PLASTIC (US) 2003-10-01 CN disclosed
US-6562719-B2 Methods of polishing, interconnect-fabrication, and producing semiconductor devices HITACHI, LTD. (JP) 2003-05-13 US disclosed
CN-1392215-A Metal polishing liquid material, metal polishing liquid, method for producing same, and polishing method using same HITACHI CHEMICAL CO LTD (JP) 2003-01-22 CN disclosed
US-20020016073-A1 Methods of polishing, interconnect-fabrication, and producing semiconductor devices HITACHI, LTD. 2002-02-07 US disclosed
CN-1220652-A improved metal-ligand complex catalyzed processes UNION CARBIDE CHEM PLASTIC (US) 1999-06-23 CN disclosed