Nitric Oxide

Nitric Oxide

SCHEMBL2890900

[N]=O.[Zr]

nearest known ligand 0.00

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Known targets — ChEMBL curated mechanism

GUCY1A1GUCY1A2GUCY1B1GUCY1B2

The experimentally established mechanism targets of Nitric Oxide. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Nitric Oxide SCHEMBL7560 0.87
Nitric Oxide SCHEMBL3993955 0.87
Nitric Oxide SCHEMBL306589 0.75
Nitric Oxide SCHEMBL2731176 0.75
Nitric Oxide SCHEMBL7184108 0.75
Nitric Oxide SCHEMBL3636459 0.75
Nitric Oxide SCHEMBL2888647 0.75
Nitric Oxide SCHEMBL37670 0.75
Nitric Oxide SCHEMBL5104249 0.75
Nitric Oxide SCHEMBL6890944 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-101521281-B Low cost fuel cell bipolar plate and manufacture method thereof GM GLOBAL TECHNOLOGY OPERATIONS, INC. (US) 2015-12-02 CN claimed
US-20100283179-A1 Method of Fabricating Metal Nitrogen Oxide Thin Film Structure ATOMIC ENERGY COUNCIL-INSTITUTE OF NUCLEAR ENERGY RESEARCH (TW) 2010-11-11 US claimed
CN-101521281-A Low cost fuel cell bipolar plate and process of making the same GM GLOBAL TECH OPERATIONS INC 2009-09-02 CN claimed
CN-101521281-B Low cost fuel cell bipolar plate and manufacture method thereof GM GLOBAL TECHNOLOGY OPERATIONS, INC. (US) 2015-12-02 CN disclosed
CN-102376566-B Method of forming a pattern structure for a semiconductor device SAMSUNG ELECTRONICS CO LTD 2015-06-10 CN disclosed
CN-104321897-A Organic photonic device AGC FLAT GLASS EUROPE SA 2015-01-28 CN disclosed
CN-104303381-A Group-III nitride semiconductor laser element SUMITOMO ELECTRIC INDUSTRIES 2015-01-21 CN disclosed
CN-103681602-A Semiconductor device with air space separating conductive structure and its manufacturing method SAMSUNG ELECTRONICS KK 2014-03-26 CN disclosed
CN-102376566-A Method of forming a pattern structure for a semiconductor device SAMSUNG ELECTRONICS CO LTD 2012-03-14 CN disclosed
US-20100283179-A1 Method of Fabricating Metal Nitrogen Oxide Thin Film Structure ATOMIC ENERGY COUNCIL-INSTITUTE OF NUCLEAR ENERGY RESEARCH (TW) 2010-11-11 US disclosed
CN-1926668-B Formation of a silicon oxynitride layer on a high-K dielectric material APPLIED MATERIALS INC 2010-09-01 CN disclosed
CN-101521281-A Low cost fuel cell bipolar plate and process of making the same GM GLOBAL TECH OPERATIONS INC 2009-09-02 CN disclosed
CN-1926668-A Formation of a silicon oxynitride layer on a high-K dielectric material APPLIED MATERIALS INC (US) 2007-03-07 CN disclosed