SCHEMBL301928

SCHEMBL301928

O=C(c1ccccc1O)c1cccc(O)c1O

nearest known ligand 0.55

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LIG1 P18858 1/20 0.55
GSTA1 P08263 2/20 0.55
HPGD P15428 5/20 0.55
LMNA P02545 3/20 0.55
CYP3A4 P08684 2/20 0.55
HIF1A Q16665 2/20 0.55
ALOX15 P16050 2/20 0.55
CYP1A2 P05177 1/20 0.55
PGR P06401 1/20 0.55
ADORA3 P0DMS8 1/20 0.55
AR P10275 1/20 0.55
CHRM1 P11229 1/20 0.55
TBXA2R P21731 1/20 0.55
SLC6A2 P23975 1/20 0.55
CYP2C19 P33261 1/20 0.55
ADRA1A P35348 1/20 0.55
KDM4E B2RXH2 4/20 0.54
ALDH1A1 P00352 4/20 0.54
SMN1; SMN2 Q16637 2/20 0.54
CA1 P00915 2/20 0.54

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30740067 1.00 LIG1 (0.55) LIG1GSTA1HPGDLMNACYP3A4
SCHEMBL245254 0.93 FNTA (0.58) LIG1GSTA1HPGDLMNACYP3A4
SCHEMBL93431 0.91 GSTA1 (0.56) LIG1GSTA1HPGDLMNACYP3A4
SCHEMBL29660832 0.91 GSTA1 (0.56) LIG1GSTA1HPGDLMNACYP3A4
2,2'-Dihydroxybenzphenone SCHEMBL18422 0.88 HPGD (0.67) LIG1GSTA1HPGDLMNACYP3A4
2,2'-Dihydroxybenzphenone SCHEMBL29572496 0.88 HPGD (0.67) LIG1GSTA1HPGDLMNACYP3A4
SCHEMBL9686287 0.87 SELL (0.66) LIG1GSTA1HPGDLMNACYP3A4
SCHEMBL29468156 0.86 HDAC1 (0.59) GSTA1HPGDLMNAALOX15KDM4E
SCHEMBL273458 0.86 HDAC1 (0.59) GSTA1HPGDLMNAALOX15KDM4E
2,2'-Dihydroxybenzphenone SCHEMBL11145317 0.85 LIG1 (0.64) LIG1GSTA1HPGDLMNACYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 2771 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2025055600-A1 SURFACE TREATMENT METHOD FOR METAL OR ALLOY, AND METAL OR ALLOY PRODUCT 福耀玻璃工业集团股份有限公司 2025-03-20 WO claimed
CN-119591780-A Photoresist additive and photoresist composition 合肥鼎材科技有限公司 2025-03-11 CN claimed
CN-115793397-B High-precision quartz substrate gluing and production process thereof 安徽禾臣新材料有限公司 2024-11-05 CN claimed
CN-118085587-B Ultraviolet absorber, modified polyester, and preparation methods and applications thereof 中国科学院宁波材料技术与工程研究所 2024-06-25 CN claimed
WO-2024128554-A1 METHOD FOR PREPARING CARBON DIOXIDE-EPOXIDE REACTION CATALYST, CARBON DIOXIDE-EPOXIDE REACTION CATALYST, AND POLYMER SYNTHESIS METHOD 아주대학교산학협력단 2024-06-20 WO claimed
CN-118119593-A Multifunctional crosslinking agent: compounds, compositions and products thereof 生物涂层有限公司 2024-05-31 CN claimed
CN-114114835-B Additive and photoresist composition containing same 陕西彩虹新材料有限公司 2024-05-28 CN claimed
CN-118085587-A Ultraviolet absorber, modified polyester, and preparation methods and applications thereof 中国科学院宁波材料技术与工程研究所 2024-05-28 CN claimed
US-20240010890-A1 FLUX-COMPATIBLE EPOXY-PHENOLIC ADHESIVE COMPOSITIONS FOR LOW GAP UNDERFILL APPLICATIONS HENKEL AG & CO. KGAA (DE) 2024-01-11 US claimed
CN-117062890-A Flux compatible epoxy-phenolic adhesive compositions for low gap underfill applications 汉高股份有限及两合公司 2023-11-14 CN claimed
EP-0089249-B1 A DEVELOPER SOLUTION FOR A POSITIVE-WORKING LIGHT-SENSITIVE COMPOSITION, AND A METHOD OF DEVELOPMENT USING THE DEVELOPER SOLUTION EASTMAN KODAK COMPANY (a New Jersey corporation) (US) 1988-05-25 EP claimed
WO-1988002878-A1 IMAGE REVERSAL SYSTEM AND PROCESS MACDERMID, INCORPORATED (US) 1988-04-21 WO claimed
US-4732836-A SOLUTION STABILITY PHENOLIC COMPOUNDS CONDENSED WITH QUINONES HOECHST CELANESE CORPORATION (US) 1988-03-22 US claimed
US-4732837-A Novel mixed ester O-quinone photosensitizers HOECHST CELANESE CORPORATION (US) 1988-03-22 US claimed
EP-0253548-A2 Method for the determination of occult blood and chemical compositions therefor SAVYON DIAGNOSTICS LTD. (IL) 1988-01-20 EP claimed
EP-0226741-A2 Process for producing a positive photoresist HOECHST CELANESE CORPORATION (US) 1987-07-01 EP claimed
US-4650745-A Method of forming a resist pattern by radiation exposure of positive-working resist coating comprising a dye and a trihydroxybenzophenone compound and subsequent aqueous alkaline development PHILIP A. HUNT CHEMICAL CORPORATION (US) 1987-03-17 US claimed
US-4626492-A Positive-working o-quinone diazide photoresist composition containing a dye and a trihydroxybenzophenone compound OLIN HUNT SPECIALTY PRODUCTS, INC. (US) 1986-12-02 US claimed
EP-0190799-A1 Method of manufacturing a device: Koninklijke Philips Electronics N.V. (NL) 1986-08-13 EP claimed
US-4550069-A PHOTOSPEED INCREASED AMERICAN HOECHST CORPORATION (US) 1985-10-29 US claimed