SCHEMBL3082230

SCHEMBL3082230

C=C(C)C(=O)OCC(=O)OCC(F)(F)C(F)(F)C(F)(F)C(F)F

nearest known ligand 0.37

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
TSHR P16473 4/20 0.37
USP2 O75604 1/20 0.33
MAPT P10636 1/20 0.33
THRB P10828 1/20 0.32
CYP1A2 P05177 1/20 0.31
CYP2C19 P33261 1/20 0.31
GAA P10253 1/20 0.31
ALDH1A1 P00352 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL183807 0.90 TSHR (0.42) TSHRUSP2MAPTTHRBCYP1A2
SCHEMBL5968073 0.87 TSHR (0.40) TSHRUSP2MAPTTHRBCYP1A2
SCHEMBL12646617 0.85 TSHR (0.31) TSHR
SCHEMBL2611522 0.85 TSHR (0.37) TSHRTHRBALDH1A1
SCHEMBL3440177 0.85 TSHR (0.42) TSHRUSP2MAPTTHRBCYP1A2
SCHEMBL712581 0.84 TSHR (0.44) TSHRUSP2MAPTTHRBCYP1A2
SCHEMBL285648 0.84 TSHR (0.44) TSHRUSP2MAPTTHRBCYP1A2
SCHEMBL2031372 0.84 TSHR (0.44) TSHRUSP2MAPTTHRBCYP1A2
SCHEMBL2610391 0.82 TSHR (0.39) TSHRTHRBALDH1A1
SCHEMBL1132225 0.80 TSHR (0.44) TSHRUSP2MAPTTHRBGAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8313886-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-11-20 US disclosed
US-8313886-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-11-20 US disclosed
US-8313886-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-11-20 US disclosed
US-20100266957-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-10-21 US disclosed
US-20100266957-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-10-21 US disclosed
US-20100266957-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-10-21 US disclosed