SCHEMBL3217482

SCHEMBL3217482

COC(=O)C(I)C1C2CC3CC(C2)CC1C3

nearest known ligand 0.38

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
EPHX1 P07099 1/20 0.37
EPHX2 P34913 4/20 0.37
L3MBTL1 Q9Y468 2/20 0.33
ALDH1A1 P00352 2/20 0.33
HSD17B10 Q99714 1/20 0.32
CHRNB2 P17787 1/20 0.32
CHRNA4 P43681 1/20 0.32
HSD11B1 P28845 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
KDM1A O60341 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL958157 0.77 EPHX1 (0.37) EPHX1EPHX2L3MBTL1ALDH1A1HSD17B10
SCHEMBL888272 0.73 EPHX1 (0.38) EPHX1EPHX2L3MBTL1ALDH1A1HSD11B1
SCHEMBL6555589 0.72 HSD11B1 (0.39) EPHX1EPHX2L3MBTL1ALDH1A1HSD11B1
SCHEMBL6555586 0.72 HSD11B1 (0.39) EPHX1EPHX2L3MBTL1ALDH1A1HSD11B1
SCHEMBL888449 0.69 L3MBTL1 (0.35) EPHX1EPHX2L3MBTL1ALDH1A1HSD11B1
SCHEMBL16435696 0.65 EPHX1 (0.49) EPHX1EPHX2L3MBTL1HSD17B10HSD11B1
SCHEMBL6655791 0.65 CYP2C9 (0.35) EPHX1EPHX2
SCHEMBL14859427 0.64 CHRNB2 (0.45) EPHX2L3MBTL1CHRNB2CHRNA4HSD11B1
SCHEMBL28944812 0.64 CHRNB2 (0.45) EPHX2L3MBTL1CHRNB2CHRNA4HSD11B1
Adamantane SCHEMBL34463641 0.64 CHRNB2 (0.43) EPHX1EPHX2L3MBTL1ALDH1A1HSD17B10

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8586281-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-19 US disclosed
US-8574809-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-05 US disclosed
US-20100055606-A1 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. 2010-03-04 US disclosed