SCHEMBL3381432

SCHEMBL3381432

O=C1CC(OS(=O)(=O)C(Cl)(Cl)Cl)C(=O)N1

nearest known ligand 0.35

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
MAP3K14 Q99558 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5855515 0.82 MAP3K14 (0.39) MAP3K14
SCHEMBL5970075 0.76 MAP3K14 (0.34) MAP3K14
SCHEMBL1028530 0.76 MAP3K14 (0.39) MAP3K14
SCHEMBL193688 0.76 MAP3K14 (0.39) MAP3K14
SCHEMBL114367 0.73 NPC1 (0.36) MAP3K14
SCHEMBL17065492 0.72 MAP3K14 (0.33) MAP3K14
SCHEMBL114517 0.71 GLA (0.37) MAP3K14
SCHEMBL10754755 0.69 MAP3K14 (0.48) MAP3K14
SCHEMBL8348991 0.69 MAP3K14 (0.48) MAP3K14
SCHEMBL17065483 0.69 NPC1 (0.37) MAP3K14

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-110471257-A The manufacturing method of photosensitive polymer combination, photosensitive dry film and its manufacturing method, resist film, substrate and plating forming object TOKYO OHKA KOGYO COMPANY 2019-11-19 CN disclosed
CN-110317174-A Hydrogen barrier, hydrogen barrier film, which are formed, uses composition, hydrogen barrier film, the manufacturing method of hydrogen barrier film and electronic component 东京应化工业株式会社 2019-10-11 CN disclosed
CN-109799680-A Chemical amplification positive photosensitive resin composition and its application 奇美实业股份有限公司 2019-05-24 CN disclosed
CN-109709770-A The manufacturing method of resin combination, dry film and manufacturing method, resist film and substrate and plating forming object, sulfhydryl compound 东京应化工业株式会社 2019-05-03 CN disclosed
CN-109557764-A Chemically amplified positive photosensitive resin composition, resist pattern and method for forming the same, and electronic device 奇美实业股份有限公司 2019-04-02 CN disclosed
CN-109116681-A Chemically amplified positive photosensitive resin composition, photoresist pattern and method for forming the same, and electronic device 奇美实业股份有限公司 2019-01-01 CN disclosed
US-9436084-B2 Positive-working photoresist composition for thick film formation TOKYO OHKA KOGYO CO., LTD. (JP) 2016-09-06 US disclosed
EP-1861751-B1 POSITIVE-WORKING PHOTORESIST COMPOSITION FOR THICK FILM FORMATION TOKYO OHKA KOGYO CO LTD (JP) 2010-11-24 EP disclosed
US-20080026321-A1 Positive-working photoresist composition for thick film formation TOKYO OHKA KOGYO CO., LTD. (JP) 2008-01-31 US disclosed
EP-1861751-A1 POSITIVE-WORKING PHOTORESIST COMPOSITION FOR THICK FILM FORMATION TOKYO OHKA KOGYO CO., LTD. (JP) 2007-12-05 EP disclosed
EP-1761823-A1 METHOD OF FORMING PLATED PRODUCT USING NEGATIVE PHOTORESIST COMPOSITION AND PHOTOSENSITIVE COMPOSITION USED THEREIN TOKYO OHKA KOGYO CO., LTD. (JP) 2007-03-14 EP disclosed
WO-2006101250-A1 POSITIVE-WORKING PHOTORESIST COMPOSITION FOR THICK FILM FORMATION TOKYO OHKA KOGYO CO., LTD. (JP) 2006-09-28 WO disclosed
WO-2006003757-A1 METHOD OF FORMING PLATED PRODUCT USING NEGATIVE PHOTORESIST COMPOSITION AND PHOTOSENSITIVE COMPOSITION USED THEREIN TOKYO OHKA KOGYO CO., LTD. (JP) 2006-01-12 WO disclosed