Water

Water

SCHEMBL3405293

[AlH3].[MgH+].[OH-].[Sc]

nearest known ligand 0.00

Full drug profile on Sugi Atlas →

Known targets — ChEMBL curated mechanism

GABRA1GABRA2GABRA3GABRA4GABRA5GABRA6GABRB1GABRB2GABRB3GABRDGABREGABRG1GABRG2GABRG3GABRPGABRQ

The experimentally established mechanism targets of Water. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Water SCHEMBL1960738 0.87 — —
Water SCHEMBL27287895 0.75 — —
Water SCHEMBL29247986 0.75 — —
Water SCHEMBL29071099 0.75 — —
Water SCHEMBL8939908 0.75 — —
Water SCHEMBL2502590 0.75 — —
Water SCHEMBL9510582 0.75 — —
SCHEMBL237763 0.71 — —
SCHEMBL28193931 0.71 — —
SCHEMBL27845195 0.71 — —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 20 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117735593-A Scandium aluminum magnesium oxide nano powder and preparation method thereof 同济大学 2024-03-22 — — CN claimed
US-12588323-B2 Nitride semiconductor substrate, semiconductor element, and method for manufacturing nitride semiconductor substrate MIE UNIVERSITY (JP) 2026-03-24 — — US disclosed
US-20250318325-A1 NITRIDE SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR ELEMENT, AND METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR SUBSTRATE MIE UNIVERSITY (JP) 2025-10-09 — — US disclosed
CN-117735593-A Scandium aluminum magnesium oxide nano powder and preparation method thereof 同济大学 2024-03-22 — — CN disclosed
CN-117735593-A Scandium aluminum magnesium oxide nano powder and preparation method thereof 同济大学 2024-03-22 — — CN disclosed
CN-117735593-A Scandium aluminum magnesium oxide nano powder and preparation method thereof 同济大学 2024-03-22 — — CN disclosed
CN-116093156-A Based on ScAlMgO 4 GaN epitaxial structure of substrate 无锡吴越半导体有限公司 2023-05-09 — — CN disclosed
US-20230100683-A1 NITRIDE SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR ELEMENT, AND METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR SUBSTRATE MIE UNIVERSITY (JP) 2023-03-30 — — US disclosed
EP-4112788-A1 NITRIDE SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR ELEMENT AND METHOD FOR PRODUCING NITRIDE SEMICONDUCTOR SUBSTRATE Mie University (JP) 2023-01-04 — — EP disclosed
CN-115176049-A Nitride semiconductor substrate, semiconductor element, and method for manufacturing nitride semiconductor substrate 国立大学法人三重大学 2022-10-11 — — CN disclosed
EP-3769346-A1 III-NITRIDE OPTOELECTRONIC DEVICES AND METHOD OF PRODUCTION King Abdullah University of Science and Technology (SA) 2021-01-27 — — EP disclosed
US-20210013374-A1 III-NITRIDE OPTOELECTRONIC DEVICES AND METHOD OF PRODUCTION KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY (SA) 2021-01-14 — — US disclosed
EP-2175054-B1 Substrate for growing wurtzite type crystal and method for manufacturing the same and semiconductor device CANON KK (JP) 2014-05-07 — — EP disclosed
US-8679650-B2 Substrate for growing wurtzite type crystal and method for manufacturing the same and semiconductor device CANON KABUSHIKI KAISHA (JP) 2014-03-25 — — US disclosed
US-8268075-B2 Method of producing zinc oxide semiconductor crystal FUJIKURA LTD. (JP) 2012-09-18 — — US disclosed
US-20100092800-A1 SUBSTRATE FOR GROWING WURTZITE TYPE CRYSTAL AND METHOD FOR MANUFACTURING THE SAME AND SEMICONDUCTOR DEVICE CANON KABUSHIKI KAISHA (JP) 2010-04-15 — — US disclosed
EP-2175054-A2 Substrate for growing wurtzite type crystal and method for manufacturing the same and semiconductor device Canon Kabushiki Kaisha (JP) 2010-04-14 — — EP disclosed
US-20090260563-A1 METHOD OF PRODUCING ZINC OXIDE SEMICONDUCTOR CRYSTAL FUJIKURA LTD. (JP) 2009-10-22 — — US disclosed
EP-2045838-A1 METHOD FOR PRODUCING ZINC OXIDE SEMICONDUCTOR CRYSTAL Fujikura, Ltd. (JP) 2009-04-08 — — EP disclosed
JP-2007246354-A METHOD FOR PRODUCING THIN FILM SUBSTRATE JAPAN SCIENCE & TECHNOLOGY AGENCY 2007-09-27 — — JP disclosed
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