SCHEMBL3454261

SCHEMBL3454261

C=C(C)C(=O)OC1CCN(C(=O)OC(C)(C)C)CC1

nearest known ligand 0.53

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
HPGD P15428 1/20 0.49
RECQL P46063 1/20 0.47
EPHX1 P07099 1/20 0.47
USP2 O75604 1/20 0.45
SMN1; SMN2 Q16637 1/20 0.45
GPR119 Q8TDV5 9/20 0.44
KDM4E B2RXH2 1/20 0.43
MAPT P10636 1/20 0.43
THRB P10828 1/20 0.43
PTPN2 P17706 1/20 0.43
PTPN1 P18031 1/20 0.43
PTPN6 P29350 1/20 0.43
ALDH1A1 P00352 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3455623 0.94 HPGD (0.47) HPGDRECQLEPHX1USP2SMN1; SMN2
SCHEMBL17721273 0.88 HPGD (0.36) HPGDRECQLEPHX1GPR119KDM4E
SCHEMBL10329344 0.86 HPGD (0.36) HPGDRECQLEPHX1GPR119
SCHEMBL3456672 0.86 HPGD (0.48) HPGDRECQLEPHX1USP2SMN1; SMN2
SCHEMBL10321396 0.85 HPGD (0.42) HPGDRECQLEPHX1USP2SMN1; SMN2
SCHEMBL1024755 0.84 HPGD (0.54) HPGDRECQLEPHX1USP2SMN1; SMN2
SCHEMBL14999243 0.83 ALDH1A1 (0.41) EPHX1USP2MAPTTHRBALDH1A1
SCHEMBL6937576 0.82 EPHX1 (0.56) HPGDRECQLEPHX1USP2SMN1; SMN2
SCHEMBL10329341 0.81 HPGD (0.39) HPGDRECQLEPHX1SMN1; SMN2GPR119
SCHEMBL16144934 0.81 NAMPT (0.34) SMN1; SMN2ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 60 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119875033-A Silicon-containing copolymer, oil-proof waterproof agent for paper, and preparation method and application thereof 浙江阪藤科技有限公司 2025-04-25 CN disclosed
US-20250076764-A1 RESIST TOPCOAT COMPOSITION, AND METHOD OF FORMING PATTERNS USING THE COMPOSITION SAMSUNG SDI CO., LTD. (KR) 2025-03-06 US disclosed
CN-119535885-A Resist topcoat composition and method of forming pattern using the same 三星SDI株式会社 2025-02-28 CN disclosed
US-20240026051-A1 CATIONIC CYCLIC AMINE AND AMPHIPATHIC TRANSFECTION REAGENTS MIRUS BIO LLC 2024-01-25 US disclosed
US-11739174-B2 Cationic cyclic amine and amphipathic transfection reagents MIRUS BIO LLC (US) 2023-08-29 US disclosed
CN-106094431-B Photoresist composition and method 罗门哈斯电子材料韩国有限公司 2020-06-26 CN disclosed
US-20190204742-A1 PATTERN FORMATION METHODS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2019-07-04 US disclosed
US-9703200-B2 Photolithographic methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2017-07-11 US disclosed
US-9703200-B2 Photolithographic methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2017-07-11 US disclosed
US-9671697-B2 Pattern treatment methods DOW GLOBAL TECHNOLOGIES LLC (US) 2017-06-06 US disclosed
US-20120183904-A1 NITROGEN-CONTAINING MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120183903-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120183904-A1 NITROGEN-CONTAINING MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120183904-A1 NITROGEN-CONTAINING MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120183903-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120183903-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120171612-A1 RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN FORMATION METHOD, AND POLYMER JSR CORPORATION (JP) 2012-07-05 US disclosed
US-20120171612-A1 RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN FORMATION METHOD, AND POLYMER JSR CORPORATION (JP) 2012-07-05 US disclosed
WO-2011037246-A1 RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN FORMATION METHOD, AND POLYMER JSR株式会社 (JP) 2011-03-31 WO disclosed
US-20100151388-A1 (Meth)acrylate compound, photosensitive polymer, and resist composition including the same CHEIL INDUSTRIES, INC. (KR) 2010-06-17 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (4 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20100151388-A1 (Meth)acrylate compound, photosensitive polymer, and resist composition including the same MMAB, TET1, MAT1A HPGD 2478/4885RECQL 2094/4885EPHX1 4159/4885
US-20120183904-A1 NITROGEN-CONTAINING MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS PARG, PCNA, PAM HPGD 1852/4885RECQL 2022/4885EPHX1 4161/4885
US-20240026051-A1 CATIONIC CYCLIC AMINE AND AMPHIPATHIC TRANSFECTION REAGENTS SLC7A1, PARN, PARG HPGD 4155/4885RECQL 1084/4885EPHX1 4508/4885
US-11739174-B2 Cationic cyclic amine and amphipathic transfection reagents SLC7A1, PARN, PARG HPGD 4155/4885RECQL 1084/4885EPHX1 4508/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.