SCHEMBL36125

SCHEMBL36125

C[S+](C)c1ccc(OS(=O)(=O)C(F)(F)F)c2ccccc12

nearest known ligand 0.34

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
DRD2 P14416 8/20 0.34
DRD3 P35462 7/20 0.34
DRD4 P21917 5/20 0.34
DRD1 P21728 3/20 0.34
DRD5 P21918 3/20 0.34
MEN1 O00255 2/20 0.34
ESR1 P03372 2/20 0.34
GAA P10253 2/20 0.34
KMT2A Q03164 2/20 0.34
ESR2 Q92731 2/20 0.34
HTR5A P47898 1/20 0.33
HTR1D P28221 2/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6566337 0.91 DRD2 (0.38) DRD2DRD3DRD4DRD1DRD5
SCHEMBL3106273 0.86 CA1 (0.30)
SCHEMBL6851155 0.85 MEN1 (0.38) DRD2DRD3DRD4DRD1DRD5
SCHEMBL271897 0.85 CA1 (0.33)
SCHEMBL2516941 0.84 DRD2 (0.38) DRD2DRD3DRD4DRD1DRD5
SCHEMBL3968936 0.84 CA1 (0.34)
SCHEMBL8636736 0.81 IDO1 (0.46)
SCHEMBL9470141 0.80 GPR3 (0.37) DRD2DRD3DRD4DRD1DRD5
SCHEMBL6938489 0.80 CYP1A2 (0.43) DRD2DRD3DRD4DRD1DRD5
SCHEMBL203899 0.78 MEN1 (0.42) DRD2DRD3DRD4DRD1DRD5

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 678 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-114779577-A Cyclodextrin inclusion compound molecular glass photoresist 南通林格橡塑制品有限公司 2022-07-22 CN claimed
CN-114442429-A Molecular glass photoresist of metallocene compound and preparation method thereof 南通林格橡塑制品有限公司 2022-05-06 CN claimed
WO-2005057285-A1 THERMAL CURABLE ONE-LIQUID TYPE EPOXY RESIN COMPOSITION FOR OVER-COAT SAMYANGEMS CO., LTD. (KR) 2005-06-23 WO claimed
EP-4714988-A1 FLUORINE-CONTAINING POLYMER, COMPOSITION FOR FORMING FLUORINE-CONTAINING RESIN FILM, FLUORINE-CONTAINING RESIN FILM, COMPOSITION FOR FORMING RESIST PATTERN, METHOD FOR FORMING RESIST PATTERN, COMPOSITION FOR FORMING RESIST UPPER LAYER FILM, METHOD FOR DECOMPOSING FLUORINE-CONTAINING POLYMER, FLUORINE-CONTAINING POLYMERIZABLE MONOMER, COMPOUND, AND METHOD FOR PRODUCING FLUORINE-CONTAINING POLYMERIZABLE MONOMER Central Glass Company, Limited (JP) 2026-03-25 EP disclosed
EP-4714990-A1 COPOLYMER, POLYMER FOR WATER-REPELLENT AGENT, COMPOSITION FOR FORMING WATER-REPELLENT FILM, RESIN FILM, AND METHOD FOR FORMING RESIST PATTERN Central Glass Company, Limited (JP) 2026-03-25 EP disclosed
WO-2024248136-A1 COPOLYMER, POLYMER FOR WATER-REPELLENT AGENT, COMPOSITION FOR FORMING WATER-REPELLENT FILM, RESIN FILM, AND METHOD FOR FORMING RESIST PATTERN セントラル硝子株式会社 2024-12-05 WO disclosed
WO-2024248135-A1 FLUORINE-CONTAINING POLYMER, COMPOSITION FOR FORMING FLUORINE-CONTAINING RESIN FILM, FLUORINE-CONTAINING RESIN FILM, COMPOSITION FOR FORMING RESIST PATTERN, METHOD FOR FORMING RESIST PATTERN, COMPOSITION FOR FORMING RESIST UPPER LAYER FILM, METHOD FOR DECOMPOSING FLUORINE-CONTAINING POLYMER, FLUORINE-CONTAINING POLYMERIZABLE MONOMER, COMPOUND, AND METHOD FOR PRODUCING FLUORINE-CONTAINING POLYMERIZABLE MONOMER セントラル硝子株式会社 2024-12-05 WO disclosed
US-20240206290-A1 DISPLAY PANEL AND MANUFACTURING METHOD THEREOF SAMSUNG DISPLAY CO., LTD. (KR) 2024-06-20 US disclosed
CN-118201424-A Display panel and manufacturing method of display panel 三星显示有限公司 2024-06-14 CN disclosed
CN-115536776-B Resin for photoresist, preparation method thereof and photoresist prepared from resin 瑞红(苏州)电子化学品股份有限公司 2023-08-29 CN disclosed
CN-115536776-A Resin for photoresist, preparation method thereof and photoresist prepared from resin 瑞红(苏州)电子化学品股份有限公司 2022-12-30 CN disclosed
US-6187504-B1 PHOTOSENSITIVE BLEND CONTAINING A NAPHTHALENE SULFONIUM SULFONATE DERIVATIVE PHOTOACID GENERATOR, RESIN HAVING ALKALI INSOLUBLE GROUPS CLEAVABLE BY ACID, AN ALKALI SOLUBLE RESIN AND A SOLUBILITY CONTROL AGENT; POSITIVES, RESOLUTION JSR CORPORATION (JP) 2001-02-13 US disclosed
US-6183934-B1 FOE USE IN FORMATION OF PATTERN OF INSULATION FILM, PASSIVATION FILM, .ALPHA.-RAY SHIELDING FILM, OPTICAL WAVEGUIDE KABUSHIKI KAISHA TOSHIBA (JP) 2001-02-06 US disclosed
US-6180316-B1 SUITABLE FOR USE AS CHEMICALLY AMPLIFIED RESIST USED IN MANUFACTURING OF INTEGRATED CIRCUITS JSR CORPORATION (JP) 2001-01-30 US disclosed
EP-1045290-A2 Composition for resist underlayer film and method for producing the same JSR Corporation (JP) 2000-10-18 EP disclosed
EP-0982628-A2 A chemical amplifying type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2000-03-01 EP disclosed
EP-0930541-A1 Radiation sensitive resin composition JSR Corporation (JP) 1999-07-21 EP disclosed
EP-0917000-A2 Positive resist composition and method for forming a resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1999-05-19 EP disclosed
EP-0856773-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1998-08-05 EP disclosed
EP-0849634-A1 Radiation sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1998-06-24 EP disclosed