SCHEMBL3788015

SCHEMBL3788015

CC(=CC(C)OCC(F)(F)F)C(=O)O

nearest known ligand 0.34

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
HTT P42858 1/20 0.34
ALDH1A1 P00352 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3791235 0.86
SCHEMBL3786703 0.85 PLA2G2C (0.33) HTTALDH1A1
SCHEMBL3781457 0.85 POLB (0.35) ALDH1A1
SCHEMBL3784649 0.83
SCHEMBL3785817 0.80 USP2 (0.33)
SCHEMBL126033 0.77 LMNA (0.33) ALDH1A1
SCHEMBL465965 0.77 LMNA (0.33) ALDH1A1
SCHEMBL3787320 0.77
SCHEMBL3785521 0.76
SCHEMBL3787743 0.76

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7858288-B2 Positive resist composition for immersion exposure, method of forming resist pattern, and fluorine-containing polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2010-12-28 US disclosed
US-20080268376-A1 POSITIVE RESIST COMPOSITION FOR IMMERSION EXPOSURE, METHOD OF FORMING RESIST PATTERN, AND FLUORINE-CONTAINING POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2008-10-30 US disclosed