SCHEMBL419120

SCHEMBL419120

O=S(=O)(O)CCCOS(=O)(=O)CCCS

nearest known ligand 0.44

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
PTGS1 P23219 1/20 0.44
PDE4A P27815 1/20 0.44
APP P05067 1/20 0.37
LMNA P02545 1/20 0.30
SLC6A6 P31641 1/20 0.30
CYP2C19 P33261 1/20 0.30
BLM P54132 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28606550 0.92 PTGS1 (0.48) PTGS1PDE4AAPPLMNASLC6A6
SCHEMBL28189201 0.87 PTGS1 (0.34) PTGS1PDE4A
SCHEMBL28056884 0.86 PTGS1 (0.33) PTGS1PDE4AAPPLMNA
SCHEMBL28495884 0.85 CA1 (0.35) PTGS1PDE4ALMNA
SCHEMBL20995951 0.84 PTGS1 (0.44) PTGS1PDE4AAPPLMNASLC6A6
SCHEMBL28886376 0.84 PTGS1 (0.44) PTGS1PDE4AAPPLMNASLC6A6
SCHEMBL29170917 0.83 APP (0.42) PTGS1PDE4AAPPLMNASLC6A6
SCHEMBL11979583 0.83 APP (0.42) PTGS1PDE4AAPPLMNASLC6A6
SCHEMBL9859212 0.82 APP (0.38) PTGS1PDE4AAPPLMNASLC6A6
SCHEMBL28372733 0.81 PTGS1 (0.50) PTGS1PDE4AAPPLMNASLC6A6

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 427 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117448899-A Electroplating solution, electroplating process and printed circuit board 上海天承化学有限公司 2024-01-26 CN claimed
CN-112725851-B Chip copper interconnection electroplating additive, preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-04-28 CN claimed
CN-112746292-B Chip copper interconnection electroplating additive, preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-04-28 CN claimed
CN-112795960-B Chip copper interconnection electroplating additive, preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-03-31 CN claimed
EP-2586893-B1 COPPER PLATING BATH AND CORRESPONDING METHOD ROHM & HAAS ELECT MAT (US) 2022-09-21 EP claimed
EP-2855738-B1 ADDITIVES FOR PRODUCING COPPER ELECTRODEPOSITS HAVING LOW OXYGEN CONTENT MACDERMID ACUMEN INC (US) 2022-07-06 EP claimed
US-11332471-B2 Leveling agent, metal plating composition containing same, preparation method therefor and use thereof SHANGHAI SINYANG SEMICONDUCTOR MATERIALS CO., LTD. (CN) 2022-05-17 US claimed
CN-112795960-A Chip copper interconnection electroplating additive, preparation method and application thereof 上海新阳半导体材料股份有限公司 2021-05-14 CN claimed
CN-112760683-A Chip copper interconnection electroplating additive, preparation method and application thereof 上海新阳半导体材料股份有限公司 2021-05-07 CN claimed
CN-112746292-A Chip copper interconnection electroplating additive, preparation method and application thereof 上海新阳半导体材料股份有限公司 2021-05-04 CN claimed
US-9869029-B2 Composition for metal plating comprising suppressing agent for void free submicron feature filling BASF SE (DE) 2018-01-16 US claimed
CN-104428452-B Additive for preparing copper electrodeposits having low oxygen content 麦克德米德尖端有限公司 2017-05-17 CN claimed
US-9243339-B2 Additives for producing copper electrodeposits having low oxygen content CITIBANK, N.A. 2016-01-26 US claimed
EP-2855738-A1 ADDITIVES FOR PRODUCING COPPER ELECTRODEPOSITS HAVING LOW OXYGEN CONTENT MacDermid Acumen, Inc. (US) 2015-04-08 EP claimed
CN-104428452-A Additive for preparing copper electrodeposits having low oxygen content MACDERMID ACUMEN INC 2015-03-18 CN claimed
US-20130313119-A1 Additives for Producing Copper Electrodeposits Having Low Oxygen Content CITIBANK, N.A. 2013-11-28 US claimed
WO-2013176796-A1 ADDITIVES FOR PRODUCING COPPER ELECTRODEPOSITS HAVING LOW OXYGEN CONTENT MACDERMID ACUMEN,INC. (US) 2013-11-28 WO claimed
EP-2483454-A2 COPPER ELECTROPLATING COMPOSITION BASF SE (DE) 2012-08-08 EP claimed
US-20120175744-A1 COPPER ELECTROPLATING COMPOSITION BASF SE (DE) 2012-07-12 US claimed
WO-2011036076-A2 COPPER ELECTROPLATING COMPOSITION BASF SE (DE) 2011-03-31 WO claimed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11332471-B2 Leveling agent, metal plating composition containing same, preparation method therefor and use thereof PRPF8, CACNA1F, ATP1B2 PTGS1 3517/4885PDE4A 2259/4885APP 996/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.