SCHEMBL439889

SCHEMBL439889

CC12CC3C(=O)OC(C3C1)C2(C)C

nearest known ligand 0.31

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
▸ ATM Q13315 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9883224 0.63 — —
SCHEMBL438919 0.61 — —
SCHEMBL18799419 0.61 — —
SCHEMBL5521764 0.60 ICAM1 (0.36) —
SCHEMBL9881053 0.60 ICAM1 (0.36) —
SCHEMBL24760217 0.59 — —
SCHEMBL21910754 0.59 ICAM1 (0.33) —
SCHEMBL21567767 0.59 ICAM1 (0.33) —
SCHEMBL21567777 0.59 — —
SCHEMBL5195583 0.59 RECQL (0.36) ATM

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 51 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20180044459-A1 NON-IONIC ARYL KETONE BASED POLYMERIC PHOTO-ACID GENERATORS CENTRAL GLASS CO., LTD. (JP) 2018-02-15 — — US disclosed
US-9221928-B2 Fluorine-containing sulfonate resin, fluorine-containing N-sulfonyloxyimide resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2015-12-29 — — US disclosed
US-9221928-B2 Fluorine-containing sulfonate resin, fluorine-containing N-sulfonyloxyimide resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2015-12-29 — — US disclosed
US-9182664-B2 Polymerizable fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern-forming method using same CENTRAL GLASS COMPANY, LIMITED (JP) 2015-11-10 — — US disclosed
US-9182664-B2 Polymerizable fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern-forming method using same CENTRAL GLASS COMPANY, LIMITED (JP) 2015-11-10 — — US disclosed
US-9152045-B2 Fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2015-10-06 — — US disclosed
US-9152045-B2 Fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2015-10-06 — — US disclosed
US-8993212-B2 Fluorine-containing sulfonic acid salts, photo-acid generator and resist composition and pattern formation method utilizing same CENTRAL GLASS COMPANY, LIMITED (JP) 2015-03-31 — — US disclosed
US-8993212-B2 Fluorine-containing sulfonic acid salts, photo-acid generator and resist composition and pattern formation method utilizing same CENTRAL GLASS COMPANY, LIMITED (JP) 2015-03-31 — — US disclosed
US-20140287359-A1 Fluorine-Containing Sulfonate, Fluorine-Containing Sulfonate Resin, Resist Composition and Pattern Formation Method CENTRAL GLASS CO LTD (JP) 2014-09-25 — — US disclosed
US-20110098500-A1 Polymerizable Fluorine-Containing Compound CENTRAL GLASS COMPANY, LIMITED (JP) 2011-04-28 — — US disclosed
US-7906269-B2 Positive-type resist composition CENTRAL GLASS COMPANY, LIMITED (JP) 2011-03-15 — — US disclosed
US-7906269-B2 Positive-type resist composition CENTRAL GLASS COMPANY, LIMITED (JP) 2011-03-15 — — US disclosed
US-7887990-B2 Fluorine-containing compound, fluorine-containing polymer, postive-type resist composition, and patterning process using same CENTRAL GLASS COMPANY, LIMITED (JP) 2011-02-15 — — US disclosed
US-7887990-B2 Fluorine-containing compound, fluorine-containing polymer, postive-type resist composition, and patterning process using same CENTRAL GLASS COMPANY, LIMITED (JP) 2011-02-15 — — US disclosed
WO-2010140483-A1 FLUORINE-CONTAINING COMPOUND, FLUORINE-CONTAINING POLYMER COMPOUND, RESIST COMPOSITION, TOP COAT COMPOSITION AND PATTERN FORMATION METHOD セントラル硝子株式会社 (JP) 2010-12-09 — — WO disclosed
US-20090061353-A1 Positive-Type Resist Composition CENTRAL GLASS COMPANY, LIMITED (JP) 2009-03-05 — — US disclosed
US-20090061353-A1 Positive-Type Resist Composition CENTRAL GLASS COMPANY, LIMITED (JP) 2009-03-05 — — US disclosed
US-20080311507-A1 Fluorine-Containing Compound, Fluorine-Containing Polymer, Postive-Type Resist Composition, And Patterning Process Using Same CENTRAL GLASS COMPANY, LIMITED (JP) 2008-12-18 — — US disclosed
US-20080311507-A1 Fluorine-Containing Compound, Fluorine-Containing Polymer, Postive-Type Resist Composition, And Patterning Process Using Same CENTRAL GLASS COMPANY, LIMITED (JP) 2008-12-18 — — US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20180044459-A1 NON-IONIC ARYL KETONE BASED POLYMERIC PHOTO-ACID GENERATORS PPARG, PPARA, PPARD ATM 2821/4885
US-20110098500-A1 Polymerizable Fluorine-Containing Compound FRG1, AFF1, H1-2 ATM 1762/4885
US-20080311507-A1 Fluorine-Containing Compound, Fluorine-Containing Polymer, Postive-Type Resist Composition, And Patterning Process Using Same FRG1, FBXL19, FEM1B ATM 2894/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.

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