SCHEMBL452162

SCHEMBL452162

CC(C)(C)c1ccc([S+](c2ccccc2)c2ccccc2)cc1.O=S(=O)([O-])c1ccccc1C(F)(F)F

nearest known ligand 0.45

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 8/20 0.45
KMT2A Q03164 3/20 0.39
MEN1 O00255 2/20 0.39
FFAR1 O14842 1/20 0.39
FFAR4 Q5NUL3 1/20 0.39
SLC22A12 Q96S37 6/20 0.39
ALDH1A1 P00352 1/20 0.39
CYP2C9 P11712 2/20 0.38
SLC22A6 Q4U2R8 2/20 0.38
SLC22A8 Q8TCC7 2/20 0.38
SLC22A11 Q9NSA0 2/20 0.38
CA1 P00915 1/20 0.37
CA2 P00918 1/20 0.37
CYP3A4 P08684 1/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29754085 1.00 HSD11B1 (0.45) HSD11B1KMT2AMEN1FFAR1FFAR4
SCHEMBL5445938 0.97 HSD11B1 (0.47) HSD11B1KMT2AMEN1FFAR1FFAR4
SCHEMBL3789167 0.91 HSD11B1 (0.45) HSD11B1KMT2AMEN1FFAR1FFAR4
SCHEMBL451959 0.90 KMT2A (0.46) HSD11B1KMT2AMEN1SLC22A12ALDH1A1
SCHEMBL3204977 0.88 SLC22A12 (0.42) HSD11B1KMT2AMEN1FFAR1FFAR4
SCHEMBL2895718 0.85 KMT2A (0.42) HSD11B1KMT2AMEN1FFAR4SLC22A12
SCHEMBL3134793 0.85 HSD11B1 (0.42) HSD11B1ALDH1A1CA1CA2
SCHEMBL3134860 0.85 HSD11B1 (0.42) HSD11B1ALDH1A1CA1CA2
SCHEMBL3192127 0.84 HSD11B1 (0.38) HSD11B1KMT2AMEN1SLC22A12ALDH1A1
SCHEMBL3202401 0.84 FFAR4 (0.39) HSD11B1KMT2AMEN1FFAR4SLC22A12

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 286 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20100119835-A1 PHOTOCURABLE COMPOSITIONS FOR PREPARING ABS-LIKE ARTICLES HUNTSMAN INTERNATIONAL LLC (US) 2010-05-13 US claimed
EP-2118197-A1 PHOTOCURABLE COMPOSITIONS FOR PREPARING ABS-LIKE ARTICLES Huntsman Advanced Materials (Switzerland) GmbH (CH) 2009-11-18 EP claimed
WO-2008110512-A1 PHOTOCURABLE COMPOSITIONS FOR PREPARING ABS-LIKE ARTICLES HUNTSMAN ADVANCED MATERIALS (SWITZERLAND) GMBH (CH) 2008-09-18 WO claimed
WO-2024141543-A1 TRIARYLSULFONIUM BASED PHOTOINITIATORS FOR LED CURE OF CATIONIC, FREE RADICAL AND HYBRID CATIONIC/FREE RADICAL FORMULATIONS ARKEMA FRANCE (FR) 2024-07-04 WO disclosed
WO-2024141537-A1 SULFONIUM SALT PHOTOINITIATORS AND METHODS OF LED CURING A COMPOSITION WITH SAID SULFONIUM SALT PHOTOINITIATORS ARKEMA FRANCE (FR) 2024-07-04 WO disclosed
WO-2024122572-A1 WAVELENGTH CONVERSION FILM-FORMING COMPOSITION AND FUSED THIOPHENE COMPOUND 日産化学株式会社 2024-06-13 WO disclosed
EP-3010943-B1 CURABLE COMPOSITION, FILM, AND METHOD OF PRODUCING FILM CANON KK (JP) 2024-04-03 EP disclosed
US-20240085784-A1 ORGANIC EL DISPLAY DEVICE TOYO INK SC HOLDINGS CO., LTD. (JP) 2024-03-14 US disclosed
US-20230364928-A1 INKJET INK, METHOD FOR MANUFACTURING PRINTED MATERIAL, AND PRINTED MATERIAL NATOCO CO., LTD. (JP) 2023-11-16 US disclosed
US-20230322998-A1 PHOTO-CURABLE RESIN COMPOSITION FOR USE IN STEREOLITHOGRAPHY BLUE CUBE IP LLC 2023-10-12 US disclosed
EP-3727797-B1 A HYBRID PHOTOPOLYMER COMPOSITION FOR ADDITIVE MANUFACTURING PERSTORP AB (SE) 2023-09-27 EP disclosed
US-20020012872-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2002-01-31 US disclosed
US-6337171-B1 AS A RESIST APPLICABLE TO FAR ULTRAVIOLET RAYS SUCH AS A KRF EXCIMER LASER, CHARGED PARTICLE RAYS SUCH AS ELECTRON BEAMS, AND X-RAYS JSR CORPORATION (JP) 2002-01-08 US disclosed
EP-1164433-A1 Radiation-sensitive resin composition JSR Corporation (JP) 2001-12-19 EP disclosed
US-20010023050-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2001-09-20 US disclosed
EP-1122605-A2 Radiation-sensitive resin composition JSR Corporation (JP) 2001-08-08 EP disclosed
US-6143460-A PHOTOACID GENERATOR PROVIDING IMPROVED PHOTORESIST RESOLUTION JSR CORPORATION (JP) 2000-11-07 US disclosed
EP-1035436-A1 Resist pattern formation method JSR Corporation (JP) 2000-09-13 EP disclosed
EP-1011029-A2 Radiation-sensitive resin composition JSR Corporation (JP) 2000-06-21 EP disclosed
EP-0959389-A1 Diazodisulfone compound and radiation-sensitive resin composition JSR Corporation (JP) 1999-11-24 EP disclosed