2-Methoxyethanol

2-Methoxyethanol

SCHEMBL4579119

C=CC.COC(=O)C(C)O.COCCO

nearest known ligand 0.38

Full drug profile on Sugi Atlas →

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
TSHR P16473 3/20 0.38
TAS1R3 Q7RTX0 1/20 0.35
TAS1R1 Q7RTX1 1/20 0.35
MEN1 O00255 4/20 0.33
KMT2A Q03164 4/20 0.33
SMN1; SMN2 Q16637 1/20 0.31
ALDH1A1 P00352 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
2-Methoxyethanol SCHEMBL3856721 0.86 TSHR (0.36) TSHRKMT2AALDH1A1
Propene SCHEMBL4579820 0.83 ALDH1A1 (0.36) TSHRTAS1R3TAS1R1MEN1KMT2A
2-Methoxyethanol SCHEMBL3217508 0.82 TSHR (0.33) TSHR
Propene SCHEMBL4579351 0.80 NAAA (0.36) TSHRTAS1R3TAS1R1MEN1KMT2A
Propene SCHEMBL6440361 0.79 TSHR (0.36) TSHRTAS1R3TAS1R1MEN1KMT2A
Propylene Glycol SCHEMBL3193743 0.79 TDP1 (0.43) TSHR
Ethylene Glycol SCHEMBL28391202 0.78 SMN1; SMN2 (0.42) TSHRMEN1KMT2ASMN1; SMN2
2-Methoxyethanol SCHEMBL15182 0.78
2-Methoxyethanol SCHEMBL6754641 0.78 TSHR (0.39) TSHRMEN1KMT2AALDH1A1
2-Methoxyethanol SCHEMBL21612730 0.78 TSHR (0.39) TSHRMEN1KMT2AALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7425404-B2 Chemical amplification resist composition and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2008-09-16 US disclosed
US-7291441-B2 Positive resist composition and pattern forming method utilizing the same FUJIFILM CORPORATION (JP) 2007-11-06 US disclosed
US-20060046190-A1 Positive resist composition and pattern forming method utilizing the same FUJI PHOTO FILM CO., LTD. 2006-03-02 US disclosed
US-20060040208-A1 Chemical amplification resist composition and pattern-forming method using the same FUJI PHOTO FILM CO., LTD. 2006-02-23 US disclosed