Propene

Propene

SCHEMBL4579351

C=CC.CCC(=O)OCCOC.COC(=O)C(C)O

nearest known ligand 0.36

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Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
NAAA Q02083 1/20 0.36
TAS1R3 Q7RTX0 1/20 0.33
TAS1R1 Q7RTX1 1/20 0.33
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31
TSHR P16473 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Propene SCHEMBL4579715 0.89 NAAA (0.35) NAAATSHR
Propene SCHEMBL143194 0.87 NAAA (0.45) NAAATSHR
Propene SCHEMBL4579820 0.84 ALDH1A1 (0.36) TAS1R3TAS1R1MEN1KMT2ATSHR
Propionic Acid SCHEMBL7662132 0.82 NAAA (0.41) NAAATSHR
Propene SCHEMBL6440361 0.81 TSHR (0.36) TAS1R3TAS1R1MEN1KMT2ATSHR
2-Methoxyethanol SCHEMBL4579796 0.80 NAAA (0.40) NAAATSHR
2-Methoxyethanol SCHEMBL4579119 0.80 TSHR (0.38) TAS1R3TAS1R1MEN1KMT2ATSHR
Propene SCHEMBL6062165 0.79 NAAA (0.52) NAAATSHR
Propene SCHEMBL181618 0.79 NAAA (0.52) NAAATSHR
SCHEMBL181426 0.77

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7425404-B2 Chemical amplification resist composition and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2008-09-16 US disclosed
US-7291441-B2 Positive resist composition and pattern forming method utilizing the same FUJIFILM CORPORATION (JP) 2007-11-06 US disclosed
US-20060046190-A1 Positive resist composition and pattern forming method utilizing the same FUJI PHOTO FILM CO., LTD. 2006-03-02 US disclosed
US-20060040208-A1 Chemical amplification resist composition and pattern-forming method using the same FUJI PHOTO FILM CO., LTD. 2006-02-23 US disclosed