SCHEMBL47523

SCHEMBL47523

C1C2C3CC(C4OC34)C2C2C1C1CC2C2OC12

nearest known ligand 0.36

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
MAPK14 Q16539 1/20 0.36
CYP3A4 P08684 1/20 0.36
TSHR P16473 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13423634 1.00 MAPK14 (0.36) MAPK14CYP3A4TSHR
SCHEMBL15383244 0.86 MAPK14 (0.30) MAPK14CYP3A4TSHR
SCHEMBL259015 0.84
SCHEMBL12519174 0.84
SCHEMBL21469294 0.82
SCHEMBL13880038 0.80
SCHEMBL47536 0.78
SCHEMBL10215878 0.76
SCHEMBL10208013 0.76
SCHEMBL12460138 0.76

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 94 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230314945-A1 NEGATIVE-TONE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2023-10-05 US disclosed
US-10317794-B2 Coloring composition, cured film, color filter, method for manufacturing color filter, solid-state imaging device, image display device, organic electroluminescent element, colorant, and method for producing colorant FUJIFILM CORPORATION (JP) 2019-06-11 US disclosed
US-20180210338-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2018-07-26 US disclosed
US-9897922-B2 Method of forming pattern and developer for use in the method FUJIFILM CORPORATION (JP) 2018-02-20 US disclosed
US-9664827-B2 Colored composition, method of producing color filter using the same, color filter and solid-state imaging device FUJIFILM CORPORATION (JP) 2017-05-30 US disclosed
US-9664827-B2 Colored composition, method of producing color filter using the same, color filter and solid-state imaging device FUJIFILM CORPORATION (JP) 2017-05-30 US disclosed
US-20170146904-A1 COLORING COMPOSITION, CURED FILM, COLOR FILTER, METHOD OF MANUFACTURING COLOR FILTER, SOLID IMAGE PICKUP ELEMENT, AND IMAGE DISPLAY APPARATUS FUJIFILM CORPORATION (JP) 2017-05-25 US disclosed
US-20170146904-A1 COLORING COMPOSITION, CURED FILM, COLOR FILTER, METHOD OF MANUFACTURING COLOR FILTER, SOLID IMAGE PICKUP ELEMENT, AND IMAGE DISPLAY APPARATUS FUJIFILM CORPORATION (JP) 2017-05-25 US disclosed
US-9650493-B2 Coloring composition, cured film, color filter, pattern forming method, method for manufacturing color filter, solid-state imaging device, and image display device FUJIFILM CORPORATION (JP) 2017-05-16 US disclosed
US-9650493-B2 Coloring composition, cured film, color filter, pattern forming method, method for manufacturing color filter, solid-state imaging device, and image display device FUJIFILM CORPORATION (JP) 2017-05-16 US disclosed
US-20110039207-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2011-02-17 US disclosed
US-20110039207-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2011-02-17 US disclosed
US-20100143844-A1 Resist composition for immersion exposure, method of forming resist pattern, and fluorine-containing resin TOKYO OHKA KOGYO CO., LTD. (JP) 2010-06-10 US disclosed
US-20100094030-A1 Preparation Of Alicyclic Diepoxides PROMERUS LLC (US) 2010-04-15 US disclosed
US-20100081080-A1 POLYMER COMPOUND, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-04-01 US disclosed
US-20100081088-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR INCLUDING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2010-04-01 US disclosed
US-20100035178-A1 Negative resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. 2010-02-11 US disclosed
US-20090297980-A1 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. 2009-12-03 US disclosed
US-20090274976-A1 Negative resist composition for immersion exposure and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2009-11-05 US disclosed
US-7598017-B2 Negative resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-06 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20100081088-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR INCLUDING THE SAME ASIC1, RER1, GRIN1 MAPK14 2968/4885CYP3A4 3282/4885TSHR 3650/4885
US-20100094030-A1 Preparation Of Alicyclic Diepoxides MVD, DLD, DHPS MAPK14 3420/4885CYP3A4 919/4885TSHR 4529/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.