SCHEMBL4835252

SCHEMBL4835252

O=C1CC2=C(C(=O)N(OS(=O)(=O)c3c(F)c(F)c(F)c(F)c3F)C2=O)C2=C[N+](=O)C(OS(=O)(=O)c3c(F)c(F)c(F)c(F)c3F)C12

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4837395 0.77 KMT2A (0.34) —
SCHEMBL2902793 0.61 KMT2A (0.45) —
SCHEMBL4834428 0.60 — —
SCHEMBL5551755 0.59 KDM4E (0.41) —
SCHEMBL2898286 0.58 KMT2A (0.66) —
SCHEMBL4829678 0.58 — —
SCHEMBL13952048 0.57 MEN1 (0.32) —
SCHEMBL4829749 0.57 CA1 (0.33) —
SCHEMBL503521 0.57 PARL (0.52) —
SCHEMBL4834476 0.57 CA12 (0.34) —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7374857-B2 Bismide compound, acid generator and resist composition each containing the same, and method of forming pattern from the composition WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2008-05-20 — — US disclosed
US-20050038261-A1 Bismide compound, acid generator and resist composition each containing the same, and method of forming pattern from the composition WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2005-02-17 — — US disclosed
EP-1449833-A1 BISIMIDE COMPOUND, ACID GENERATOR AND RESIST COMPOSITION EACH CONTAINING THE SAME, AND METHOD OF FORMING PATTERN FROM THE COMPOSITION Wako Pure Chemical Industries, Ltd. (JP) 2004-08-25 — — EP disclosed
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