SCHEMBL499373

SCHEMBL499373

O=C(OCc1cccc([N+](=O)[O-])c1[N+](=O)[O-])OCc1cccc([N+](=O)[O-])c1[N+](=O)[O-]

nearest known ligand 0.50

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
GPR35 Q9HC97 2/20 0.50
TSHR P16473 3/20 0.46
MAOB P27338 1/20 0.46
TDP1 Q9NUW8 2/20 0.44
ALDH1A1 P00352 7/20 0.42
HTT P42858 1/20 0.40
L3MBTL1 Q9Y468 1/20 0.39
HPGD P15428 1/20 0.39
MEN1 O00255 1/20 0.38
KMT2A Q03164 1/20 0.38
CTSD P07339 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5604448 0.88 MAOB (0.50) GPR35TSHRMAOBTDP1ALDH1A1
SCHEMBL5490051 0.88 GPR35 (0.47) GPR35TSHRMAOBTDP1ALDH1A1
SCHEMBL286962 0.85 MAOB (0.56) TSHRMAOBALDH1A1HTTL3MBTL1
SCHEMBL11026110 0.84 GPR35 (0.44) GPR35TSHRMAOBALDH1A1HTT
SCHEMBL11239213 0.84 MAOB (0.44) GPR35TSHRMAOBTDP1ALDH1A1
SCHEMBL2821427 0.83 TSHR (0.52) GPR35TSHRMAOBTDP1ALDH1A1
SCHEMBL11025870 0.83 MAOB (0.46) GPR35TSHRMAOBTDP1ALDH1A1
SCHEMBL15093078 0.82 MAOB (0.42) GPR35TSHRMAOBTDP1ALDH1A1
SCHEMBL17964396 0.81 MAOB (0.41) GPR35TSHRMAOBALDH1A1MEN1
SCHEMBL17964398 0.79 MAOB (0.40) GPR35TSHRMAOBALDH1A1MEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 155 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4667537-A1 PRIMER COMPOSITION, LAMINATE, AND METHOD FOR PRODUCING LAMINATE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-12-24 EP disclosed
US-20250382500-A1 PRIMER COMPOSITION, LAMINATE, AND METHOD FOR PRODUCING LAMINATE TOKYO OHKA KOGYO CO LTD (JP) 2025-12-18 US disclosed
US-20250271751-A1 PHOTOSENSITIVE COMPOSITION, PHOTOSENSITIVE FILM, LOWER LAYER FILM, METHOD FOR PRODUCING STRUCTURE HAVING PHASE-SEPARATED STRUCTURE, AND COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2025-08-28 US disclosed
US-20250189895-A1 METHOD OF MANUFACTURING PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-06-12 US disclosed
US-20250172872-A1 CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTOSENSITIVE COMPOSITION, METHOD OF MANUFACTURING SUBSTRATE WITH TEMPLATE, AND METHOD OF MANUFACTURING PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-05-29 US disclosed
CN-119620544-A Photosensitive resin composition, dry film, photosensitive dry film, resist film, molded substrate with mold, and method for producing plated molded article 东京应化工业株式会社 2025-03-14 CN disclosed
EP-3961676-B1 ETCHING METHOD AND PHOTOSENSITIVE RESIN COMPOSITION TOKYO OHKA KOGYO CO LTD (JP) 2025-01-22 EP disclosed
CN-110317174-B Hydrogen barrier agent, composition for forming hydrogen barrier film, method for producing hydrogen barrier film, and electronic device 东京应化工业株式会社 2024-10-22 CN disclosed
CN-118829948-A Method for manufacturing plating shaped article 东京应化工业株式会社 2024-10-22 CN disclosed
CN-118742854-A Chemically amplified positive photosensitive composition, method for producing molded substrate with mold, and method for producing plated molded article 东京应化工业株式会社 2024-10-01 CN disclosed
US-20060141387-A1 Chemically amplified positive photoresist composition for thick film, thick-film photoresist laminated product, manufacturing method for thick-film resist pattern, and manufacturing method for connection terminal TOKYO OHKA KOGYO CO., LTD. (JP) 2006-06-29 US disclosed
US-20060141386-A1 Chemically amplified positive photoresist composition for thick film, thick-film photoresist laminated product, manufacturing method for thick-film resist pattern, and manufacturing method for connection terminal TOKYO OHKA KOGYO CO., LTD. (JP) 2006-06-29 US disclosed
US-20060141388-A1 Chemically amplified positive photoresist composition for thick film, thick-film photoresist laminated product, manufacturing method for thick-film resist pattern, and manufacturing method for connection terminal TOKYO OHKA KOGYO CO. LTD. (JP) 2006-06-29 US disclosed
US-7063934-B2 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same TOYKO OHKA KOGYO CO., LTD. (JP) 2006-06-20 US disclosed
US-20060035170-A1 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same SAITO KOJI 2006-02-16 US disclosed
US-20060035169-A1 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. 2006-02-16 US disclosed
WO-2006003757-A1 METHOD OF FORMING PLATED PRODUCT USING NEGATIVE PHOTORESIST COMPOSITION AND PHOTOSENSITIVE COMPOSITION USED THEREIN TOKYO OHKA KOGYO CO., LTD. (JP) 2006-01-12 WO disclosed
US-6838229-B2 Chemically amplified negative photoresist composition for the formation of thick films, photoresist base material and method of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. (JP) 2005-01-04 US disclosed
US-20030064319-A1 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. 2003-04-03 US disclosed
US-20030039921-A1 Chemically amplified negative photoresist composition for the formation of thick films, photoresist base material and method of forming bumps using the same TOKYO OHKA KOGYO CO., LTD. 2003-02-27 US disclosed