SCHEMBL5394202

SCHEMBL5394202

C=C(C)C(=O)OC(C)[Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C

nearest known ligand 0.41

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.41
ALDH1A1 P00352 2/20 0.39
THRB P10828 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3886364 0.83 TSHR (0.43) TSHRALDH1A1THRB
SCHEMBL145421 0.83 TSHR (0.43) TSHRALDH1A1THRB
SCHEMBL25329223 0.81 TSHR (0.42) TSHRALDH1A1THRB
SCHEMBL6925919 0.78 ALDH1A1 (0.43) TSHRALDH1A1
SCHEMBL16537575 0.78 ALDH1A1 (0.43) TSHRALDH1A1
SCHEMBL4196691 0.77 TSHR (0.42) TSHRALDH1A1THRB
SCHEMBL193159 0.75 ALDH1A1 (0.44) TSHRALDH1A1THRB
SCHEMBL9820071 0.75 TSHR (0.37) TSHRALDH1A1
SCHEMBL1772850 0.75 TSHR (0.37) TSHRALDH1A1THRB
SCHEMBL16537597 0.73 TSHR (0.40) TSHRALDH1A1THRB

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7232638-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-06-19 US disclosed
US-7135269-B2 Polymer, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2006-11-14 US disclosed
US-20050260521-A1 Polymer, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2005-11-24 US disclosed
US-6780781-B2 Method for manufacturing an electronic device RENESAS TECHNOLOGY CORPORATION (JP) 2004-08-24 US disclosed
US-20030224291-A1 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2003-12-04 US disclosed
US-20030224560-A1 Method for manufacturing an electronic device HITACHI, LTD. 2003-12-04 US disclosed
US-6492089-B2 POLYMER BEARING CYCLIC SILICON-CONTAINING GROUPS SUCH AS 1,4,4-TRIMETHYL-4-SILACYCLOHEXYL METHACRYLATE; USE AS CHEMICALLY AMPLIFIED POSITIVE RESIST SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-12-10 US disclosed
US-20010003772-A1 Polymer, resist composition and patterning process SHIN-ETSU CHEMICDL CO., LTD. OF (JP) 2001-06-14 US disclosed
US-6210856-B1 Resist composition and process of forming a patterned resist layer on a substrate INTERNATIONAL BUSINESS MACHINES CORPORATION 2001-04-03 US disclosed