SCHEMBL5524337

SCHEMBL5524337

CCC(C)(C)OC(=O)C[O]

nearest known ligand 0.38

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.38
TSHR P16473 1/20 0.38
TDP1 Q9NUW8 1/20 0.38
GAA P10253 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL142215 0.82 TSHR (0.39) ALDH1A1TSHRTDP1GAA
SCHEMBL2380925 0.82 ALDH1A1 (0.39) ALDH1A1TSHRTDP1GAA
SCHEMBL620517 0.82 GAA (0.42) ALDH1A1TSHRTDP1GAA
SCHEMBL8011953 0.81 ALDH1A1 (0.35) ALDH1A1TSHRTDP1
SCHEMBL5524339 0.80 ALDH1A1 (0.38) ALDH1A1TSHRTDP1GAA
Ethane SCHEMBL28422864 0.80 ALDH1A1 (0.38) ALDH1A1TSHRTDP1GAA
SCHEMBL17860728 0.79 ALDH1A1 (0.33) ALDH1A1TSHRTDP1
SCHEMBL4863036 0.78 ALDH1A1 (0.46) ALDH1A1TSHRTDP1
SCHEMBL1258085 0.78 ALDH1A1 (0.36) ALDH1A1TSHRTDP1
SCHEMBL1998916 0.78 ALDH1A1 (0.50) ALDH1A1TSHRTDP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20070148585-A1 Hyperbranched polymer, production method therefor and resist composition containing hyperbranched polymer LION CORPORATION. 2007-06-28 US disclosed
EP-1698645-A1 HYPERBRANCHED POLYMER, PROCESS FOR PRODUCING THE SAME AND RESIST COMPOSITION CONTAINING THE HYPERBRANCHED POLYMER Lion Corporation (JP) 2006-09-06 EP disclosed
EP-1059563-B1 Agent for reducing substrate dependence of resist WAKO PURE CHEM IND LTD (JP) 2006-08-09 EP disclosed
US-6586152-B1 Useful as an ingredient of a resist composition used for preparation of semiconductor devices and the like, which comprises a compound shown by the following general formula useful as an ingredient of a resist composition used for WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2003-07-01 US disclosed
EP-1059563-A1 Agent for reducing substrate dependence of resist Wako Pure Chemical Industries, Ltd. (JP) 2000-12-13 EP disclosed