SCHEMBL562455

SCHEMBL562455

O=C(C(Cl)(Cl)CO)C(Cl)(Cl)CO

nearest known ligand 0.33

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.33
TP53 P04637 1/20 0.33
TSHR P16473 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL259584 0.76
SCHEMBL8968643 0.73
SCHEMBL10712669 0.71 TSHR (0.33) ALDH1A1TP53TSHR
SCHEMBL3244472 0.67 ALDH1A1 (0.36) ALDH1A1TSHR
SCHEMBL6751899 0.65 FDPS (0.39) ALDH1A1TP53TSHR
Benzene SCHEMBL10830312 0.65 ALDH1A1 (0.35) ALDH1A1TP53TSHR
SCHEMBL6591460 0.65
Trichlorethanol SCHEMBL28825711 0.64 TSHR (0.41) ALDH1A1TP53TSHR
Trichlorethanol SCHEMBL1027 0.62
Trichlorethanol SCHEMBL28245853 0.62 LMNA (0.36) ALDH1A1TSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 27 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-101223205-A Novel organic bottom antireflective polymer compositions AZ ELECTRONIC MATERIALS USA (US) 2008-07-16 CN claimed
US-20070020557-A1 New organic bottom antireflective polymer compositions AZ ELECTRONIC MATERIALS USA CORP. 2007-01-25 US claimed
US-4088500-A AMIDE-ENDCAPPED HYDROPHILIC ALKYLENE OXIDE PREPOLYMER, ACID ACTIVATED CROSSLINKING AGENT WATER, FILLER, CATALYST MINNESOTA MINING AND MANUFACTURING COMPANY (US) 1978-05-09 US claimed
US-11493845-B2 Organic bottom antireflective coating composition for nanolithography ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2022-11-08 US disclosed
US-11092894-B2 Method for forming pattern using anti-reflective coating composition comprising photoacid generator ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2021-08-17 US disclosed
CN-105223774-B Method of forming pattern using anti-reflective coating composition including photoacid generator 罗门哈斯电子材料韩国有限公司 2019-12-20 CN disclosed
US-20160187781-A1 METHOD FOR FORMING PATTERN USING ANTI-REFLECTIVE COATING COMPOSITION COMPRISING PHOTOACID GENERATOR DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2016-06-30 US disclosed
US-20150185614-A1 ORGANIC BOTTOM ANTIREFLECTIVE COATING COMPOSITION FOR NANOLITHOGRAPHY DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2015-07-02 US disclosed
US-8927681-B2 Coating composition for use with an overcoated photoresist ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2015-01-06 US disclosed
US-20120034562-A1 COATING COMPOSITION FOR USE WITH AN OVERCOATED PHOTORESIST WAYTON GERALD B (US) 2012-02-09 US disclosed
US-7582360-B2 Microelectronic wafers having photosensitive antireflective polyester and photoresist multilayers used to form integrated circuits; relief images ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2009-09-01 US disclosed
EP-1598702-A1 Coating compositions for use with an overcoated photoresist Rohm and Haas Electronic Materials, L.L.C. (US) 2005-11-23 EP disclosed
WO-2005097883-A2 METHOD OF PRODUCING A CROSSLINKED COATING IN THE MANUFACTURE OF INTEGRATED CIRCUITS KING INDUSTRIES, INC. (US) 2005-10-20 WO disclosed
US-20050215713-A1 Method of producing a crosslinked coating in the manufacture of integrated circuits KING INDUSTRIES, INC. 2005-09-29 US disclosed
US-6852421-B2 Microelectronic wafers having photosensitive antireflective polyester and photoresist multilayers used to form integrated circuits; relief images SHIPLEY COMPANY, L.L.C. (US) 2005-02-08 US disclosed
US-20040209200-A1 spin-on antireflective coating compositions that contain an aromatic polyester resin and a solvent comprising an oxyisobutyric acid ester, especially methyl-2-hydroxyisobutyrate; SHIPLEY COMPANY, L.L.C. 2004-10-21 US disclosed
CN-1482192-A Coating compositions for use with an overcoated photoresist 希普雷公司 2004-03-17 CN disclosed
US-20030180559-A1 Microelectronic wafers having photosensitive antireflective polyester and photoresist multilayers used to form integrated circuits; relief images SHIPLEY COMPANY, L.L.C. 2003-09-25 US disclosed
EP-1298492-A2 Coating compositions for use with an overcoated photoresist Shipley Co. L.L.C. (US) 2003-04-02 EP disclosed
US-4088500-A AMIDE-ENDCAPPED HYDROPHILIC ALKYLENE OXIDE PREPOLYMER, ACID ACTIVATED CROSSLINKING AGENT WATER, FILLER, CATALYST MINNESOTA MINING AND MANUFACTURING COMPANY (US) 1978-05-09 US disclosed