SCHEMBL601845

SCHEMBL601845

COc1c2ccccc2c(OC)c2cc(C(=O)O)ccc12

nearest known ligand 0.54

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 5/20 0.54
MAPK1 P28482 2/20 0.54
ALDH1A1 P00352 2/20 0.54
SMN1; SMN2 Q16637 1/20 0.54
CA1 P00915 2/20 0.50
CA2 P00918 2/20 0.50
TPMT P51580 2/20 0.50
CA12 O43570 1/20 0.50
CA4 P22748 1/20 0.50
CA6 P23280 1/20 0.50
CA7 P43166 1/20 0.50
CA9 Q16790 1/20 0.50
CA14 Q9ULX7 1/20 0.50
TTR P02766 3/20 0.49
HTT P42858 2/20 0.47
GRIN2D O15399 1/20 0.46
GRIN2A Q12879 1/20 0.46
GRIN2C Q14957 1/20 0.46
LMNA P02545 1/20 0.46
RAB9A P51151 1/20 0.46

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30044523 0.84 KIF11 (0.58) KDM4EMAPK1ALDH1A1SMN1; SMN2CA1
SCHEMBL609398 0.84 KIF11 (0.58) KDM4EMAPK1ALDH1A1SMN1; SMN2CA1
SCHEMBL10012830 0.78 GRIN2D (0.61) KDM4EALDH1A1TTRGRIN2DGRIN2A
SCHEMBL19177351 0.78 GRIN2D (0.61) KDM4EALDH1A1TTRGRIN2DGRIN2A
SCHEMBL2343264 0.78 GRIN2D (0.61) KDM4EALDH1A1TTRGRIN2DGRIN2A
SCHEMBL4280339 0.77 ALDH1A1 (0.53) KDM4EMAPK1ALDH1A1SMN1; SMN2CA12
SCHEMBL15855056 0.77 TPMT (0.53) KDM4EMAPK1SMN1; SMN2CA1CA2
SCHEMBL15855109 0.77 TPMT (0.53) KDM4EMAPK1CA1CA2TPMT
SCHEMBL978869 0.76 KDM4E (0.59) KDM4EALDH1A1SMN1; SMN2TTRGRIN2D
SCHEMBL28826423 0.75 PTGER4 (0.57) KDM4EMAPK1ALDH1A1SMN1; SMN2HTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11635688-B2 Photoimageable compositions and processes for fabrication of relief patterns on low surface energy substrates KAYAKU ADVANCED MATERIALS, INC. (US) 2023-04-25 US claimed
US-20150024326-A1 PHOTOIMAGEABLE COMPOSITIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES KAYAKU ADVANCED MATERIALS, INC. 2015-01-22 US claimed
WO-2013134104-A2 PHOTOIMAGEABLE COMPOSITIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES MICROCHEM CORP. (US) 2013-09-12 WO claimed
US-12189291-B2 Epoxy formulations and processes for fabrication of relief patterns on low surface energy substrates KAYAKU ADVANCED MATERIALS, INC. (US) 2025-01-07 US disclosed
US-11635688-B2 Photoimageable compositions and processes for fabrication of relief patterns on low surface energy substrates KAYAKU ADVANCED MATERIALS, INC. (US) 2023-04-25 US disclosed
EP-2753662-B1 EPOXY FORMULATIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES MICROCHEM CORP (US) 2020-06-24 EP disclosed
CN-103874731-B Epoxy formulations and methods for producing relief patterns on low surface energy substrates 微量化学公司 2017-02-15 CN disclosed
US-20150024326-A1 PHOTOIMAGEABLE COMPOSITIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES KAYAKU ADVANCED MATERIALS, INC. 2015-01-22 US disclosed
US-20140302430-A1 EPOXY FORMULATIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES MICROCHEM CORP. (US) 2014-10-09 US disclosed
CN-103874731-A Epoxy formulations and methods for producing relief patterns on low surface energy substrates MICROCHEM CORP 2014-06-18 CN disclosed
WO-2013134104-A2 PHOTOIMAGEABLE COMPOSITIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES MICROCHEM CORP. (US) 2013-09-12 WO disclosed
EP-1880248-A2 METHOD OF FORMING A PHOTORESIST ELEMENT MicroChem Corp. (US) 2008-01-23 EP disclosed
CN-1934498-A Permanent resist composition, cured product thereof, and use thereof MICROCHEM CORP (US) 2007-03-21 CN disclosed
EP-1730592-A2 PERMANENT RESIST COMPOSITION, CURED PRODUCT THEREOF, AND USE THEREOF MicroChem Corp. (US) 2006-12-13 EP disclosed
WO-2006124552-A2 METHOD OF FORMING A PHOTORESIST ELEMENT MICROCHEM CORP. (US) 2006-11-23 WO disclosed
US-20060257785-A1 Method of forming a photoresist element MICROCHEM CORP. 2006-11-16 US disclosed
WO-2005119364-A2 PHOTOIMAGEABLE COATING COMPOSITION AND COMPOSITE ARTICLE THEREOF MICROCHEM CORP. (US) 2005-12-15 WO disclosed
US-20050266335-A1 Photoimageable coating composition and composite article thereof MicroChem Corp., a corporation 2005-12-01 US disclosed
WO-2005079330-A2 PERMANENT RESIST COMPOSITION, CURED PRODUCT THEREOF, AND USE THEREOF MICROCHEM CORP. (US) 2005-09-01 WO disclosed
US-6180320-B1 Method of manufacturing a semiconductor device having a fine pattern, and semiconductor device manufactured thereby MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2001-01-30 US disclosed