SCHEMBL6326748

SCHEMBL6326748

O=COCCNCCC(=O)O

nearest known ligand 0.44

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 2/20 0.38
S1PR1 P21453 10/20 0.37
S1PR3 Q99500 5/20 0.37
S1PR5 Q9H228 1/20 0.36
ECE1 P42892 1/20 0.33
LMNA P02545 1/20 0.33
ALKBH5 Q6P6C2 1/20 0.33
SUCNR1 Q9BXA5 1/20 0.33
EGLN1 Q9GZT9 1/20 0.33
TSHR P16473 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL383965 0.79
SCHEMBL109879 0.78 LMNA (0.53) LTA4HECE1LMNAALKBH5SUCNR1
SCHEMBL5029763 0.78 DGKA (0.34) LTA4H
SCHEMBL15330241 0.76 ALDH1A1 (0.50) LTA4HS1PR1S1PR3TSHR
SCHEMBL17433002 0.75 LMNA (0.50) LTA4HECE1LMNAALKBH5SUCNR1
SCHEMBL12491912 0.75 LMNA (0.50) LTA4HECE1LMNAALKBH5SUCNR1
SCHEMBL28473579 0.75 LMNA (0.50) LTA4HECE1LMNAALKBH5SUCNR1
SCHEMBL162041 0.75 LMNA (0.50) LTA4HECE1LMNAALKBH5SUCNR1
SCHEMBL20415450 0.75 LMNA (0.50) LTA4HECE1LMNAALKBH5SUCNR1
SCHEMBL5035377 0.75 LMNA (0.50) LTA4HECE1LMNAALKBH5SUCNR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-101625524-B Photoresist composition and pattern forming method SHINETSU CHEMICAL CO JP 2012-11-28 CN disclosed
CN-102591152-A Resist composition and patterning process SHIN ETSU EHEMICAL CO LTD 2012-07-18 CN disclosed
CN-102520581-A Method for forming photoresist pattern SHINETSU CHEMICAL CO 2012-06-27 CN disclosed
CN-101625524-A Photoresist composition and pattern forming method SHINETSU CHEMICAL CO 2010-01-13 CN disclosed
US-20050079446-A1 Novel polymerizable compound, polymer, positive-resist composition, and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2005-04-14 US disclosed
US-20050079440-A1 Novel polymer, positive resist composition, and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2005-04-14 US disclosed