SCHEMBL64189

SCHEMBL64189

Cc1ccc(S(=O)(=O)[O-])cc1.c1ccc([S+](c2ccccc2)c2ccccc2)cc1

nearest known ligand 0.47

Known targets — ChEMBL curated mechanism

CHRM1CHRM2CHRM3CHRM4CHRM5SLC6A2dacAdacBdacCftsImrcAmrcBmrdA

The experimentally established mechanism targets of None. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CA12 O43570 4/20 0.47
CA9 Q16790 4/20 0.47
CA1 P00915 3/20 0.47
CA2 P00918 3/20 0.47
GAA P10253 4/20 0.46
HTT P42858 1/20 0.46
SMN1; SMN2 Q16637 1/20 0.46
CYP3A4 P08684 3/20 0.44
CYP2D6 P10635 2/20 0.44
CYP1A2 P05177 2/20 0.44
KDM4E B2RXH2 1/20 0.44
ALDH1A1 P00352 1/20 0.44
CYP2C9 P11712 1/20 0.44
HPGD P15428 1/20 0.44
ALOX12 P18054 1/20 0.44
CYP2C19 P33261 1/20 0.44
GFER P55789 1/20 0.44
TDP1 Q9NUW8 1/20 0.44
LMNA P02545 1/20 0.44
MAPK1 P28482 1/20 0.44

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7133269 1.00 CA12 (0.47) CA12CA9CA1CA2GAA
SCHEMBL3144525 0.98 CA12 (0.46) CA12CA9CA1CA2GAA
P-Xylene SCHEMBL3404430 0.98 GAA (0.46) CA12CA9CA1CA2GAA
SCHEMBL2964104 0.98 CA12 (0.46) CA12CA9CA1CA2GAA
SCHEMBL2962482 0.96 GAA (0.45) CA12CA9CA1CA2GAA
SCHEMBL2955936 0.94 GAA (0.46) CA12CA9CA1CA2GAA
SCHEMBL3135344 0.90 LMNA (0.43) CA12CA9CA1CA2GAA
SCHEMBL3135080 0.90 ACHE (0.42) CA12CA9CA1CA2GAA
SCHEMBL547499 0.90 ACHE (0.42) CA12CA9CA1CA2GAA
SCHEMBL3136301 0.90 LMNA (0.43) CA12CA9CA1CA2GAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 3258 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119668028-A Negative photoresist composition, application thereof and imaging method 福建泓光半导体材料有限公司 2025-03-21 CN claimed
CN-119487452-A Enhanced EUV photoresist and method of use thereof 亚历克斯·P·G·罗宾逊 2025-02-18 CN claimed
US-20240294771-A1 ANTI-REFLECTIVE COATING COMPOSITION AND CROSSLINKABLE POLYMER Tan Kah Kee Innovation Laboratory (CN) 2024-09-05 US claimed
CN-118295209-A Photoresist composition containing two sulfonium salts and preparation method and application thereof 中国科学院化学研究所 2024-07-05 CN claimed
CN-118244576-A Photosensitive resin composition and cured film thereof 罗门哈斯电子材料韩国有限公司 2024-06-25 CN claimed
CN-117452768-A Composition for immersion photoresist top coating 徐州博康信息化学品有限公司 2024-01-26 CN claimed
WO-2023070957-A1 ANTI-REFLECTIVE COATING COMPOSITION AND CROSSLINKABLE POLYMER 嘉庚创新实验室 2023-05-04 WO claimed
CN-113913075-B Anti-reflective coating composition and crosslinkable polymer 嘉庚创新实验室 2022-09-20 CN claimed
EP-2326744-B1 METAL COMPOSITIONS AND METHODS OF MAKING SAME PRYOG LLC (US) 2022-06-01 EP claimed
CN-113913075-A Anti-reflective coating composition and crosslinkable polymer 嘉庚创新实验室 2022-01-11 CN claimed
US-6436606-B1 POLYMERS AND PHOTORESISTS COATING SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-08-20 US claimed
EP-0827970-B1 New acid-labile group protected hydroxystyrene polymers or copolymers thereof and their application to radiation sensitive materials CLARIANT FINANCE BVI LTD (VG) 2001-09-26 EP claimed
US-20010009749-A1 Chemically amplified resist NEC CORPORATION 2001-07-26 US claimed
WO-2001029837-A1 MEDIUM FOR FLUORESCENT READ-ONLY MULTILAYER OPTICAL INFORMATION CARRIER AND ITS MANUFACTURING METHOD TRID STORE IP, LLC (US) 2001-04-26 WO claimed
US-6096478-A Resist material for forming a chemically amplified negative type resist pattern and method of manufacturing a semiconductor device employing the resist pattern NEC CORPORATION (JP) 2000-08-01 US claimed
CN-1227355-A Photoresist material and method for producing semiconductor constituted of corrosion resist picture thereof NEC CORP (JP) 1999-09-01 CN claimed
US-5852128-A Acid-labile group protected hydroxystyrene polymers or copolymers thereof and their application to radiation sensitive materials CLARIANT AG (CH) 1998-12-22 US claimed
EP-0827970-A2 New acid-labile group protected hydroxystyrene polymers or copolymers thereof and their application to radiation sensitive materials Clariant AG (CH) 1998-03-11 EP claimed
US-5629134-A SOLVENT, ALKALI SOLUBLE RESIN, ACID GENERATOR, PYRIDINE SALT SHIN-ETSU CHEMICAL CO., LTD. (JP) 1997-05-13 US claimed
US-4108747-A Curable compositions and method for curing such compositions GENERAL ELECTRIC COMPANY (US) 1978-08-22 US claimed