SCHEMBL6721082

SCHEMBL6721082

CC(C)(C)C(C)(C)C(=O)Oc1ccc(C(=O)Oc2ccccc2)cc1

nearest known ligand 0.59

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
MAPT P10636 5/20 0.59
TDP1 Q9NUW8 3/20 0.59
L3MBTL1 Q9Y468 1/20 0.59
ELANE P08246 6/20 0.55
PARP10 Q53GL7 1/20 0.54
KMT2A Q03164 4/20 0.51
ALDH1A1 P00352 1/20 0.51
PKM P14618 1/20 0.51
SMN1; SMN2 Q16637 1/20 0.50
MEN1 O00255 2/20 0.49
TMPRSS15 P98073 2/20 0.49
PRSS1 P07477 1/20 0.49
ACR P10323 1/20 0.49
NSD2 O96028 1/20 0.46
RAB9A P51151 1/20 0.45

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16300513 0.87 ELANE (0.73) MAPTTDP1L3MBTL1ELANEPARP10
SCHEMBL6721075 0.83 ELANE (0.53) MAPTTDP1L3MBTL1ELANEKMT2A
SCHEMBL6721014 0.83 MAPT (0.58) MAPTTDP1L3MBTL1ELANEPARP10
SCHEMBL825366 0.81 MAPT (0.56) MAPTTDP1L3MBTL1ELANEPARP10
SCHEMBL8205435 0.80 PARP10 (0.78) MAPTTDP1L3MBTL1ELANEPARP10
SCHEMBL70034 0.80 PARP10 (0.70) MAPTTDP1L3MBTL1PARP10KMT2A
SCHEMBL5705949 0.80 MAPT (0.63) MAPTTDP1L3MBTL1ELANEPARP10
SCHEMBL6721074 0.80 ELANE (0.55) MAPTL3MBTL1ELANEKMT2ASMN1; SMN2
SCHEMBL26375073 0.79 PARP10 (0.65) MAPTTDP1L3MBTL1PARP10KMT2A
SCHEMBL68278 0.79 PARP10 (0.63) MAPTTDP1L3MBTL1PARP10KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8182975-B2 Positive resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2012-05-22 US disclosed
US-20080248419-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-09 US disclosed