SCHEMBL677067

SCHEMBL677067

CC(C)C1C2CC3CC(C2)CC1C3

nearest known ligand 0.39

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.39
CYP1A2 P05177 1/20 0.39
CYP3A4 P08684 1/20 0.39
CYP2D6 P10635 1/20 0.39
TSHR P16473 1/20 0.39
KMT2A Q03164 1/20 0.39
NISCH Q9Y2I1 1/20 0.39
CYP2C9 P11712 1/20 0.38
EPHX1 P07099 1/20 0.36
EPHX2 P34913 1/20 0.35
SLC22A2 O15244 1/20 0.31
SLC47A1 Q96FL8 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25465432 0.77 CYP2C9 (0.35) CYP2C9EPHX1EPHX2
SCHEMBL1548216 0.77 SLC22A2 (0.39) MEN1CYP1A2CYP3A4CYP2D6TSHR
SCHEMBL6655791 0.77 CYP2C9 (0.35) CYP2C9EPHX1EPHX2
SCHEMBL7714569 0.77 CYP2C9 (0.35) CYP2C9EPHX1EPHX2
SCHEMBL679325 0.77 CYP2C9 (0.41) CYP2C9EPHX1EPHX2
SCHEMBL19655057 0.75 EPHX1 (0.33) MEN1CYP2D6KMT2ACYP2C9EPHX1
SCHEMBL10882209 0.75 EPHX1 (0.33) CYP2C9EPHX1EPHX2
SCHEMBL14649672 0.73 EPHX1 (0.33) CYP2C9EPHX1EPHX2
SCHEMBL5410703 0.73 EPHX1 (0.33) CYP2C9EPHX1EPHX2
SCHEMBL24270380 0.71 CYP2C9 (0.40) CYP2C9EPHX2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 309 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11834539-B2 Photocurable material composition, cured product of photocurable material composition and manufacturing method thereof CANON KABUSHIKI KAISHA (JP) 2023-12-05 US claimed
US-8722321-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-05-13 US claimed
US-20120276485-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-11-01 US claimed
US-20120270159-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-10-25 US claimed
EP-1558654-A4 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF FUJIFILM ELECTRONIC MATERIALS (US) 2006-04-05 EP claimed
EP-1558654-A2 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF Fujifilm Electronic Materials USA, Inc. (US) 2005-08-03 EP claimed
US-6916543-B2 Copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. (US) 2005-07-12 US claimed
US-20040137362-A1 Novel copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. 2004-07-15 US claimed
WO-2004040371-A2 NOVEL COPOLYMER AND PHOTORESIST COMPOSITIONS THEREOF ARCH SPECIALTY CHEMICALS, INC. (US) 2004-05-13 WO claimed
US-20240231226-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-07-11 US disclosed
US-20240219830-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-07-04 US disclosed
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-06-27 US disclosed
US-20240210823-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-06-27 US disclosed
US-12013636-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-06-18 US disclosed
US-20050014095-A1 Sulfonate and a resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2005-01-20 US disclosed
US-20040137362-A1 Novel copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. 2004-07-15 US disclosed
WO-2004040371-A2 NOVEL COPOLYMER AND PHOTORESIST COMPOSITIONS THEREOF ARCH SPECIALTY CHEMICALS, INC. (US) 2004-05-13 WO disclosed
US-20040067436-A1 Polymerizable silicon-containing compound, manufacturing method, polymer, resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-04-08 US disclosed
US-4043927-A Friction or tractive drive containing ethers of adamantanes SUN VENTURES, INC. (US) 1977-08-23 US disclosed
US-4008251-A TRACTION FLUID ADDITIVES SUN OIL COMPANY, (SUN RESEARCH AND DEVELOPMENT CO.) 1977-02-15 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-12013636-B2 Salt, acid generator, resist composition and method for producing resist pattern RER1, FGFR1, NHERF1 MEN1 2209/4885CYP1A2 413/4885CYP3A4 1895/4885
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SCO2, CBR1, OXGR1 MEN1 2790/4885CYP1A2 892/4885CYP3A4 591/4885
US-20240219830-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-0, HCN3, RER1 MEN1 1558/4885CYP1A2 785/4885CYP3A4 1805/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.