SCHEMBL682074

SCHEMBL682074

COC(C)OCCOc1ccc(C(C)C)cc1C(C)C

nearest known ligand 0.40

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
SMN1; SMN2 Q16637 3/20 0.39
HTT P42858 2/20 0.39
ALDH1A1 P00352 5/20 0.37
L3MBTL1 Q9Y468 2/20 0.37
LMNA P02545 1/20 0.37
KMT2A Q03164 2/20 0.37
MEN1 O00255 1/20 0.37
CYP1A2 P05177 1/20 0.37
CYP3A4 P08684 1/20 0.37
CYP2C9 P11712 1/20 0.37
CYP2C19 P33261 1/20 0.37
RECQL P46063 1/20 0.37
MAPT P10636 1/20 0.35
FDPS P14324 3/20 0.34
TSHR P16473 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14094040 0.87 SMN1; SMN2 (0.35) SMN1; SMN2HTTALDH1A1L3MBTL1LMNA
SCHEMBL14443357 0.86 SMN1; SMN2 (0.38) SMN1; SMN2HTTALDH1A1L3MBTL1LMNA
SCHEMBL14117888 0.80 RXRA (0.37) TSHR
SCHEMBL12889916 0.79 ALDH1A1 (0.42) SMN1; SMN2HTTALDH1A1L3MBTL1LMNA
SCHEMBL682847 0.79 KCNH2 (0.39) SMN1; SMN2HTTALDH1A1L3MBTL1LMNA
SCHEMBL12889914 0.78 CALM1 (0.42) SMN1; SMN2HTTALDH1A1L3MBTL1LMNA
SCHEMBL18713791 0.77 ALDH1A1 (0.47) SMN1; SMN2ALDH1A1L3MBTL1LMNAKMT2A
SCHEMBL739698 0.73 HDAC4 (0.48) SMN1; SMN2ALDH1A1KMT2AMEN1TSHR
SCHEMBL22337391 0.72 ALDH1A1 (0.54) SMN1; SMN2ALDH1A1TSHR
SCHEMBL19129510 0.71 SMN1; SMN2 (0.56) SMN1; SMN2HTTALDH1A1L3MBTL1LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9090722-B2 Chemical amplification resist composition, and mold preparation method and resist film using the same FUJIFILM CORPORATION (JP) 2015-07-28 US disclosed
US-9090722-B2 Chemical amplification resist composition, and mold preparation method and resist film using the same FUJIFILM CORPORATION (JP) 2015-07-28 US disclosed
US-20120006788-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-12 US disclosed
US-20120006788-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-12 US disclosed
WO-2010150917-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2010-12-29 WO disclosed
US-20080206668-A1 NEGATIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-08-28 US disclosed