SCHEMBL683605

SCHEMBL683605

CCC(C)c1ccc(OC(C)OCCOc2ccc(OC3CCCCC3)cc2)cc1

nearest known ligand 0.46

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 5/20 0.46
KDM4E B2RXH2 1/20 0.41
KMT2A Q03164 2/20 0.39
MEN1 O00255 1/20 0.39
TDP1 Q9NUW8 1/20 0.39
TSHR P16473 1/20 0.39
ACACB O00763 4/20 0.38
FFAR1 O14842 1/20 0.37
ALOX12 P18054 1/20 0.37
APP P05067 1/20 0.36
HRH3 Q9Y5N1 1/20 0.36
HIF1A Q16665 1/20 0.35
CYP1A2 P05177 1/20 0.35
CYP2D6 P10635 1/20 0.35
CYP2C19 P33261 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL111764 0.86 ALDH1A1 (0.46) ALDH1A1KDM4EKMT2AMEN1TDP1
SCHEMBL14287838 0.86 ALDH1A1 (0.42) ALDH1A1KDM4ETSHRACACBALOX12
SCHEMBL2607811 0.85 ALDH1A1 (0.41) ALDH1A1KDM4EKMT2AMEN1TDP1
SCHEMBL683620 0.85 ALDH1A1 (0.47) ALDH1A1KDM4EKMT2AMEN1TDP1
SCHEMBL14573487 0.83 ALDH1A1 (0.48) ALDH1A1KMT2ATSHRACACBFFAR1
SCHEMBL17931689 0.81 HRH3 (0.45) ALDH1A1KDM4EKMT2AMEN1TDP1
SCHEMBL683155 0.80 KDM4E (0.42) ALDH1A1KDM4EACACBFFAR1HRH3
SCHEMBL111973 0.80 ALDH1A1 (0.49) ALDH1A1KMT2AMEN1TDP1TSHR
SCHEMBL682235 0.80 ALDH1A1 (0.48) ALDH1A1KMT2AMEN1TDP1TSHR
SCHEMBL683579 0.79 PPARG (0.40) ALDH1A1KMT2AMEN1TDP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9090722-B2 Chemical amplification resist composition, and mold preparation method and resist film using the same FUJIFILM CORPORATION (JP) 2015-07-28 US disclosed
US-9090722-B2 Chemical amplification resist composition, and mold preparation method and resist film using the same FUJIFILM CORPORATION (JP) 2015-07-28 US disclosed
US-20120006788-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-12 US disclosed
US-20120006788-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-12 US disclosed
WO-2010150917-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2010-12-29 WO disclosed
US-7344821-B2 Positive resist composition for use with electron beam, EUV light or X ray, and pattern formation method using the same FUJIFILM CORPORATION (JP) 2008-03-18 US disclosed
US-7326513-B2 Positive working resist composition FUJIFILM CORPORATION (JP) 2008-02-05 US disclosed